by Miyajima, H., Asaoka, N., Isokawa, T., Ogata, M., Aoki, Y., Imai, M., Fujimori, O., Katashiro, M., Matsumoto, K.
Published in Journal of microelectromechanical systems (01.06.2003)

by Peper, F., Jia Lee, Abo, F., Isokawa, T., Adachi, S., Matsui, N., Mashiko, S.
Published in IEEE transactions on nanotechnology (01.03.2004)

by Peper, F., Isokawa, T., Kouda, N., Matsui, N.
Published in Future generation computer systems (01.08.2002)

by Kamiura, N., Fukuda, T., Saitoh, A., Isokawa, T., Matsui, N., Tabuchi, H.
Published in 2013 IEEE 43rd International Symposium on Multiple-Valued Logic (01.05.2013)

by Isokawa, T., Matsui, N., Nishimura, H., Peper, F.
Published in IEEE transactions on systems, man and cybernetics. Part A, Systems and humans (01.07.2002)

by Kamiura, N., Ohtsuka, A., Tanii, H., Isokawa, T., Matsui, N.
Published in 2005 IEEE International Conference on Systems, Man and Cybernetics (2005)

by Kamiura, N., Isokawa, T., Matsui, N.
Published in 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings (2004)

by Kamiura, N., Isokawa, T., Matsui, N.
Published in 13th Asian Test Symposium (2004)

by Kamiura, N., Isokawa, T., Matsui, N.
Published in Proceedings - International Symposium on Multiple-Valued Logic (2002)

by Kamiura, N., Taniguchi, Y., Isokawa, T., Matsui, N.
Published in Proceedings - Asian Test Symposium (2001)

by Isokawa, Teijiro, Nishimura, Haruhiko, Kamiura, Naotake, Matsui, Nobuyuki
Published in International journal of neural systems (01.04.2008)

by Nomoto, T., Hosokai, S., Isokawa, T., Hyuga, R., Nakajima, S., Terada, T.
Published in IEEE transactions on electron devices (01.10.1997)

by Kamiura, N., Tomita, M., Isokawa, T., Matsui, N.
Published in Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2001)

by Matsui, Nobuyuki, Isokawa, Teijiro, Kusamichi, Hiromi, Peper, Ferdinand, Nishimura, Haruhiko
Published in Journal of intelligent & fuzzy systems (01.01.2004)

by Isokawa, T, Matsui, N, Peper, F, Umeo, H
Year of Publication 2010

by Isokawa, T., Adumi, J., Matsui, N., Nishimura, H.
Published in SICE 2003 Annual Conference (IEEE Cat. No.03TH8734) (2003)

by Kamiura, N., Yamato, K., Isokawa, T., Matsui, N.
Published in Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) (2002)

by MASUDA, Takao, ISOKAWA, Toyoharu
Published in Kansenshogaku Zasshi (01.02.1991)

by Isokawa, T., Abo, F., Peper, F., Kamiura, N., Matsui, N.
Published in SICE 2003 Annual Conference (IEEE Cat. No.03TH8734) (2003)

by Kamiura, N., Isokawa, T., Matsui, N., Yamato, K.
Published in Proceedings Seventh International On-Line Testing Workshop (2001)