Single-Event Effects in Heavy-Ion Irradiated 3-kV SiC Charge-Balanced Power Devices
Sengupta, Arijit, Ball, Dennis R., Islam, Sajal, Senarath, Aditha S., Sternberg, Andrew L., Zhang, En Xia, Alles, Michael L., Osheroff, Jason M., Ghandi, Reza, Jacob, Biju, Goswami, Shubhodeep, Hitchcock, Collin W., Hutson, John M., Reed, Robert A., Galloway, Kenneth F., Schrimpf, Ronald D., Witulski, Arthur F.
Published in IEEE transactions on nuclear science (01.08.2024)
Published in IEEE transactions on nuclear science (01.08.2024)
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Journal Article
LET and Voltage Dependence of Single-Event Burnout and Single-Event Leakage Current in High-Voltage SiC Power Devices
Sengupta, Arijit, Ball, Dennis R., Sternberg, Andrew L., Islam, Sajal, Senarath, Aditha S., Reed, Robert A., McCurdy, Michael W., Zhang, En Xia, Hutson, John M., Alles, Michael L., Osheroff, Jason M., Jacob, Biju, Hitchcock, Collin W., Goswami, Shubhodeep, Schrimpf, Ronald D., Galloway, Kenneth F., Witulski, Arthur F.
Published in IEEE transactions on nuclear science (01.04.2024)
Published in IEEE transactions on nuclear science (01.04.2024)
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Journal Article
Single-Event Burnout by Cf-252 Irradiation in Vertical \beta-Ga2O3 Diodes with Pt and PtOx Schottky Contacts and High Permittivity Dielectric Field Plate
Islam, Sajal, Senarath, Aditha S., Sengupta, Arijit, Zhang, En Xia, Ball, Dennis R., Fleetwood, Daniel M., Schrimpf, Ronald D., Farzana, Esmat, Bhattacharyya, Arkka, Hendricks, Nolan S., Speck, James S.
Published in 2023 Device Research Conference (DRC) (25.06.2023)
Published in 2023 Device Research Conference (DRC) (25.06.2023)
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