Comprehensive Time Dependent Dielectric Breakdown (TDDB) Characterization of Ferroelectric Capacitors Under Bipolar Stress Conditions
Ravikumar, Priyankka Gundlapudi, Ravindran, Prasanna Venkatesan, Aabrar, Khandker Akif, Song, Taeyoung, Kirtania, Sharadindu Gopal, Das, Dipjyoti, Park, Chinsung, Afroze, Nashrah, Tian, Mengkun, Yu, Shimeng, Islam, Ahmad Ehtesham, Datta, Suman, Mahapatra, Souvik, Khan, Asif
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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