Assessment of the Trench IGBT reliability: low temperature experimental characterization
Azzopardi, S., Benmansour, A., Ishiko, M., Woirgard, E.
Published in Microelectronics and reliability (01.09.2005)
Published in Microelectronics and reliability (01.09.2005)
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Low loss static induction devices (transistors and thyristors)
Tadano, H., Ishiko, M., Kawaji, S., Taga Toyota, Y.
Published in Microelectronics and reliability (01.09.1997)
Published in Microelectronics and reliability (01.09.1997)
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GaN enhancement mode metal-oxide semiconductor field effect transistors
Irokawa, Y., Nakano, Y., Ishiko, M., Kachi, T., Kim, J., Ren, F., Gila, B. P., Onstine, A. H., Abernathy, C. R., Pearton, S. J., Pan, C.-C., Chen, G.-T., Chyi, J.-I.
Published in Physica status solidi. C (01.05.2005)
Published in Physica status solidi. C (01.05.2005)
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Cosmic ray ruggedness of IGBTs for hybrid vehicles
Nishida, S, Shoji, T, Ohnishi, T, Fujikawa, T, Nose, N, Ishiko, M, Hamada, K
Published in 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2010)
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Published in 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2010)
Conference Proceeding
Effects of uni-axial mechanical stress on IGBT characteristics
Usui, Masanori, Ishiko, Masayasu, Hotta, Koji, Kuwano, Satoshi, Hashimoto, Masato
Published in Microelectronics and reliability (01.09.2005)
Published in Microelectronics and reliability (01.09.2005)
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Investigation of correlation between device structures and switching losses of IGBTs
Machida, S., Sugiyama, T., Ishiko, M., Yasuda, S., Saito, J., Hamada, K.
Published in 2009 21st International Symposium on Power Semiconductor Devices & IC's (01.06.2009)
Published in 2009 21st International Symposium on Power Semiconductor Devices & IC's (01.06.2009)
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Population-Based Prevalence and 5-Year Change of Soft Drusen, Pseudodrusen, and Pachydrusen in a Japanese Population
Sato-Akushichi, Miki, Kinouchi, Reiko, Ishiko, Satoshi, Hanada, Kazuomi, Hayashi, Hiroki, Mikami, Daiki, Ono, Shinji, Yanagi, Yasuo
Published in Ophthalmology science (Online) (01.12.2021)
Published in Ophthalmology science (Online) (01.12.2021)
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Mechanical stress dependence of power device electrical characteristics
Tanaka, H., Hotta, K., Kuwano, S., Usui, M., Ishiko, M.
Published in 2006 IEEE International Symposium on Power Semiconductor Devices and IC's (2006)
Published in 2006 IEEE International Symposium on Power Semiconductor Devices and IC's (2006)
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Investigation of IGBT turn-on failure under high applied voltage operation
ISHIKO, Masayasu, HOTTA, Koji, KAWAJI, Sachiko, SUGIYAMA, Takahide, SHOUJI, Tomoyuki, FUKAMI, Takeshi, HAMADA, Kimimori
Published in Microelectronics and reliability (01.09.2004)
Published in Microelectronics and reliability (01.09.2004)
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A Toe Keloid after Syndactyly Release Treated with Surgical Excision and Intralesional Steroid Injection
Yamawaki, Satoko, Naitoh, Motoko, Ishiko, Toshihiro, Aya, Rino, Katayama, Yasuhiro, Suzuki, Shigehiko
Published in Plastic and reconstructive surgery. Global open (01.07.2014)
Published in Plastic and reconstructive surgery. Global open (01.07.2014)
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Investigations on current filamentation of IGBTs under undamped inductive switching conditions
Shoji, T., Ishiko, M., Fukami, T., Ueta, T., Hamada, K.
Published in Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005 (2005)
Published in Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005 (2005)
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Thermal behavior of He-irradiation-induced defects in silicon
Nakano, Yoshitaka, Ishiko, Masayasu, Tadano, Hiroshi, Myler, Uwe, Simpson, Peter
Published in Journal of crystal growth (01.03.2000)
Published in Journal of crystal growth (01.03.2000)
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