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"Irani, C. H."
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Neutron Fluence and Electric Field Strength Dependencies of the Rate of Volume Damage Introduction in Silicon P-N Junctions
by
Goben, C. A.
,
Irani
,
C
.
H
.
,
Johnson, P. E.
Published in
IEEE transactions on nuclear science
(01.01.1969)
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Electric Field Strength Dependence of Surface Damage in Oxde Passivated Silicon Planar Transistors
by
Goben, C. A.
,
Irani
,
C
.
H
.
Published in
IEEE transactions on nuclear science
(01.12.1970)
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Journal Article
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engineering
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Topic
degradation
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forward contracts
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p-n junctions
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annealing
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bismuth
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capacitance
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English
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IEEE Electronic Library (IEL)
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