by Yuh, Jong Hak, Li, Yen-Lung Jason, Li, Heguang, Oyama, Yoshihiro, Hsu, Cynthia, Anantula, Pradeep, Jeong, Gwang Yeong Stanley, Amarnath, Anirudh, Darne, Siddhesh, Bhatia, Sneha, Tang, Tianyu, Arya, Aditya, Rastogi, Naman, Ookuma, Naoki, Mizukoshi, Hiroyuki, Yap, Alex, Wang, Demin, Kim, Steve, Wu, Yonggang, Peng, Min, Lu, Jason, Ip, Tommy, Malhotra, Seema, Han, Taekeun, Okumura, Masatoshi, Liu, Jiwen, Sohn, Jeongduk John, Chibvongodze, Hardwell, Balaga, Muralikrishna, Matsuda, Akihiro, Chen, Chen, K. V., Indra, G., V. S. N. K. Chaitanya, Ramachandra, Venky, Kato, Yosuke, Kumar, Ravi J., Wang, Huijuan, Moogat, Farookh, Yoon, In-Soo, Kanda, Kazushige, Shimizu, Takahiro, Shibata, Noboru, Yanagidaira, Kosuke, Kodama, Takuyo, Fukuda, Ryo, Hirashima, Yasuhiro, Abe, Mitsuhiro
Published in IEEE journal of solid-state circuits (01.01.2023)

by Yuh, Jong, Li, Jason, Li, Heguang, Oyama, Yoshihiro, Hsu, Cynthia, Anantula, Pradeep, Jeong, Stanley, Amarnath, Anirudh, Darne, Siddhesh, Bhatia, Sneha, Tang, Tianyu, Arya, Aditya, Rastogi, Naman, Ookuma, Naoki, Mizukoshi, Hiroyuki, Yap, Alex, Wang, Demin, Kim, Steve, Wu, Yonggang, Peng, Min, Lu, Jason, Ip, Tommy, Malhotra, Seema, Han, David, Okumura, Masatoshi, Liu, Jiwen, Sohn, John, Chibvongodze, Hardwell, Balaga, Muralikrishna, Matsuda, Aki, Puri, Chakshu, Chen, Chen, V, Indra K, G, Chaitanya, Ramachandra, Venky, Kato, Yosuke, Kumar, Ravi, Wang, Huijuan, Moogat, Farookh, Yoon, In-Soo, Kanda, Kazushige, Shimizu, Takahiro, Shibata, Noboru, Shigeoka, Takashi, Yanagidaira, Kosuke, Kodama, Takuyo, Fukuda, Ryo, Hirashima, Yasuhiro, Abe, Mitsuhiro
Published in 2022 IEEE International Solid- State Circuits Conference (ISSCC) (20.02.2022)

by Cernea, R.-A., Long Pham, Moogat, F., Siu Chan, Binh Le, Yan Li, Shouchang Tsao, Tai-Yuan Tseng, Khanh Nguyen, Li, J., Jayson Hu, Jong Hak Yuh, Hsu, C., Fanglin Zhang, Kamei, T., Nasu, H., Kliza, P., Khin Htoo, Lutze, J., Yingda Dong, Higashitani, M., Junnhui Yang, Hung-Szu Lin, Sakhamuri, V., Li, A., Feng Pan, Yadala, S., Taigor, S., Pradhan, K., Lan, J., James Chan, Abe, T., Fukuda, Y., Mukai, H., Kawakami, K., Liang, C., Ip, T., Shu-Fen Chang, Lakshmipathi, J., Huynh, S., Pantelakis, D., Mofidi, M., Quader, K.
Published in IEEE journal of solid-state circuits (01.01.2009)

by Cernea, Raul, Pham, Long, Moogat, Farookh, Chan, Siu, Le, Binh, Li, Yan, Tsao, Shouchang, Tseng, Tai-Yuan, Nguyen, Khanh, Li, Jason, Hu, Jayson, Park, Jong, Hsu, Cynthia, Zhang, Fanglin, Kamei, Teruhiko, Nasu, Hiroaki, Kliza, Phil, Htoo, Khin, Lutze, Jeffrey, Dong, Yingda, Higashitani, Masaaki, Yang, Junhui, Lin, Hung-Szu, Sakhamuri, Vamshi, Li, Alan, Pan, Feng, Yadala, Sridhar, Taigor, Subodh, Pradhan, Kishan, Lan, James, Chan, James, Abe, Takumi, Fukuda, Yasuyuki, Mukai, Hideo, Kawakami, Koichi, Liang, Connie, Ip, Tommy, Chang, Shu-Fen, Lakshmipathi, Jaggi, Huynh, Sharon, Pantelakis, Dimitris, Mofidi, Mehrdad, Quader, Khandker
Published in 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers (01.02.2008)