A Study on the Effect of Energy Storage Systems and Distributed Generators on Reliability
Kim, Beopsoo, Lee, Dayoung, Rusetskii, Nikita, Shusterzon, Konstantin, Sidorov, Denis, Song, Minseok, Kim, Insu
Published in 2021 24th International Conference on Electrical Machines and Systems (ICEMS) (31.10.2021)
Published in 2021 24th International Conference on Electrical Machines and Systems (ICEMS) (31.10.2021)
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Conference Proceeding
P-class is a proper subclass of NP-class; and more
Kim, JongJin, Kim, GwangJin, Lee, JongPyo, Wang, ShuanHong, Nam, Ki-Bong, Seo, GyungSig, Kim, InSu, Kim, YangGon
Year of Publication 22.02.2022
Year of Publication 22.02.2022
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Journal Article
The effect of the volt/var control of photovoltaic systems on the time-series steady-state analysis of a distribution network
Kim, Insu, Harley, Ronald G., Regassa, Raeey, Del Valle, Yamille
Published in 2015 Clemson University Power Systems Conference (PSC) (01.03.2015)
Published in 2015 Clemson University Power Systems Conference (PSC) (01.03.2015)
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Conference Proceeding
SEMICONDUCTOR DEVICES
Yim, Soobin, Park, Kijong, Park, Imsoo, Lee, Kiseok, Kim, Insu, Maeng, Seohyun
Year of Publication 21.09.2023
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Year of Publication 21.09.2023
Patent
ELECTRONIC DEVICE INCLUDING HEAT DISSIPATION STRUCTURE
OH, Hyunmin, LEE, Daegi, PARK, Sungjin, LEE, Jonghyun, KANG, Daegyu, KIM, Insu
Year of Publication 06.09.2023
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Year of Publication 06.09.2023
Patent
Comparative study of CWO and ZnSe(Te) scintillation detector on the performance of X-ray imaging system
Kwak, Sung-Woo, Cho, Gyuseong, Kim, Bong-Hwan, Kim, Insu, Sung Jae, Moo
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21.01.2005)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21.01.2005)
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Journal Article
METHOD FOR AUTOMATICALLY EVALUATING LABELING RELIABILITY OF TRAINING IMAGES FOR USE IN DEEP LEARNING NETWORK TO ANALYZE IMAGES, AND RELIABILITY-EVALUATING DEVICE USING THE SAME
Sung, Myungchul, Ryu, Wooju, Nam, Woonhyun, Boo, SukHoon, Kim, Yongjoong, Cho, Hojin, Kim, Hak-Kyoung, Kim, Kye-Hyeon, Yeo, Donghun, Jeong, Kyungjoong, Kim, Insu, Jang, Taewoong, Je, Hongmo
Year of Publication 07.08.2024
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Year of Publication 07.08.2024
Patent