An embedded 90 nm SONOS nonvolatile memory utilizing hot electron programming and uniform tunnel erase
Swift, C.T., Chindalore, G.L., Harber, K., Harp, T.S., Hoefler, A., Hong, C.M., Ingersoll, P.A., Li, C.B., Prinz, E.J., Yater, J.A.
Published in Digest. International Electron Devices Meeting (2002)
Published in Digest. International Electron Devices Meeting (2002)
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