Test Planning for Core-based Integrated Circuits under Power Constraints
SenGupta, Breeta, Nikolov, Dimitar, Ingelsson, Urban, Larsson, Erik
Published in Journal of electronic testing (01.02.2017)
Published in Journal of electronic testing (01.02.2017)
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Journal Article
Abort-on-Fail Test Scheduling for Modular SOCs without and with Preemption
Ingelsson, Urban, Goel, Sandeep Kumar, Larsson, Erik, Marinissen, Erik Jan
Published in IEEE transactions on computers (01.12.2015)
Published in IEEE transactions on computers (01.12.2015)
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Journal Article
Access Time Analysis for IEEE P1687
Zadegan, F. G., Ingelsson, U., Carlsson, G., Larsson, E.
Published in IEEE transactions on computers (01.10.2012)
Published in IEEE transactions on computers (01.10.2012)
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Journal Article
Scheduling Tests for 3D Stacked Chips under Power Constraints
SenGupta, Breeta, Ingelsson, Urban, Larsson, Erik
Published in Journal of electronic testing (01.02.2012)
Published in Journal of electronic testing (01.02.2012)
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Journal Article
Process Variation-Aware Test for Resistive Bridges
Ingelsson, U., Al-Hashimi, B.M., Khursheed, S., Reddy, S.M., Harrod, P.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.08.2009)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.08.2009)
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Journal Article
Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints
Zadegan, F. G., Ingelsson, U., Asani, G., Carlsson, G., Larsson, E.
Published in 2011 Asian Test Symposium (01.11.2011)
Published in 2011 Asian Test Symposium (01.11.2011)
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Conference Proceeding
Test Time Analysis for IEEE P1687
Zadegan, F G, Ingelsson, U, Carlsson, G, Larsson, E
Published in 2010 19th IEEE Asian Test Symposium (01.12.2010)
Published in 2010 19th IEEE Asian Test Symposium (01.12.2010)
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Conference Proceeding
Investigation into voltage and process variation-aware manufacturing test
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Conference Proceeding
Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias
SenGupta, B., Ingelsson, U., Larsson, E.
Published in 2012 25th International Conference on VLSI Design (01.01.2012)
Published in 2012 25th International Conference on VLSI Design (01.01.2012)
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Conference Proceeding
Efficient Embedding of Deterministic Test Data
Majeed, M, Ahlström, Daniel, Ingelsson, U, Carlsson, G, Larsson, E
Published in 19th IEEE Asian Test Symposium (ATS10), Shanghai, China, December 1-4, 2010. (01.12.2010)
Published in 19th IEEE Asian Test Symposium (ATS10), Shanghai, China, December 1-4, 2010. (01.12.2010)
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Conference Proceeding
Design automation for IEEE P1687
Zadegan, F G, Ingelsson, U, Carlsson, G, Larsson, E
Published in 2011 Design, Automation & Test in Europe (01.03.2011)
Published in 2011 Design, Automation & Test in Europe (01.03.2011)
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Conference Proceeding
Variation Aware Analysis of Bridging Fault Testing
Ingelsson, U., Al-Hashimi, B.M., Harrod, P.
Published in 2008 17th Asian Test Symposium (01.11.2008)
Published in 2008 17th Asian Test Symposium (01.11.2008)
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Conference Proceeding
Resistive Bridging Faults DFT with Adaptive Power Management Awareness
Ingelsson, U., Rosinger, P., Khursheed, S.S., Al-Hashimi, B.M., Harrod, P.
Published in 16th Asian Test Symposium (ATS 2007) (01.10.2007)
Published in 16th Asian Test Symposium (ATS 2007) (01.10.2007)
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Conference Proceeding
Addressing model complexity in automotive system development: Selection of system model elements for allocation of requirements
Liebel, Grischa, Olaru, Andreea, Lonn, Henrik, Kaijser, Henrik, Rajendran, Sunith, Ingelsson, Urban, Svensson, Richard Berntsson
Published in 2016 4th International Conference on Model-Driven Engineering and Software Development (MODELSWARD) (01.02.2016)
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Published in 2016 4th International Conference on Model-Driven Engineering and Software Development (MODELSWARD) (01.02.2016)
Conference Proceeding
Fault injection and fault handling: An MPSoC demonstrator using IEEE P1687
Petersen, Kim, Nikolov, Dimitar, Ingelsson, Urban, Carlsson, Gunnar, Zadegan, Farrokh Ghani, Larsson, Erik
Published in 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) (01.07.2014)
Published in 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) (01.07.2014)
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Conference Proceeding
Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687
Ghani Zadegan, Farrokh, Ingelsson, U., Larsson, E., Carlsson, G.
Published in IEEE design & test of computers (2012)
Published in IEEE design & test of computers (2012)
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Journal Article