Impact of X-Ray Exposure on a Triple-Level-Cell NAND Flash
Gadlage, Matthew J., Kay, Matthew J., Ingalls, J. David, Duncan, Adam R., Ashley, Shawn A.
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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Journal Article
Extreme Value Analysis in Flash Memories for Dosimetry Applications
Savage, Mark W., Gadlage, Matthew J., Kay, Matthew, Ingalls, J. David, Duncan, Adam
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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Journal Article
Total Dose and Heavy Ion Radiation Response of 55 nm Avalanche Technology Spin Transfer Torque MRAM
Ingalls, J. David, Gadlage, Matthew J., Wang, Jonathan, Williams, Aaron M., Bruce, David I., Ranjan, Rajiv Y.
Published in 2019 IEEE Radiation Effects Data Workshop (01.07.2019)
Published in 2019 IEEE Radiation Effects Data Workshop (01.07.2019)
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Conference Proceeding
Total Ionizing Dose Effects in Commercial Floating-Gate-Alternative Non-Volatile Memories
Gadlage, Matthew J., Kay, Matthew J., Bruce, David I., Roach, Austin H., Duncan, Adam R., Williams, Aaron M., Ingalls, J. David
Published in 2017 IEEE Radiation Effects Data Workshop (REDW) (01.07.2017)
Published in 2017 IEEE Radiation Effects Data Workshop (REDW) (01.07.2017)
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Conference Proceeding
Impact of Neutron-Induced Displacement Damage on the Multiple Bit Upset Sensitivity of a Bulk CMOS SRAM
Gadlage, M. J., Kay, M. J., Duncan, A. R., Savage, M. W., Ingalls, J. D., Cruz-Rodriguez, D., Howard, A.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Leakage Current Degradation of Gallium Nitride Transistors Due to Heavy Ion Tests
Olson, Brian D., Ingalls, J. David, Rice, Casey H., Hedge, Casey C., Cole, Patrick L., Duncan, Adam R., Armstrong, Sarah E.
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
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Conference Proceeding
Heavy Ion Testing of Commercial GaN Transistors in the Radio Frequency Spectrum
Armstrong, Sarah E., Bole, Ken, Bradley, Holly, Johnson, Ethan, Staggs, James, Shedd, Walter, Cole, Patrick L., Rice, Casey H., Ingalls, J. David, Hedge, Casey C., Duncan, Adam R., Olson, Brian D.
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
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Conference Proceeding