Phase separation in SiOx films annealed under enhanced hydrostatic pressure
Rudko, G. Yu, Maidanchuk, I. Yu, Indutnyy, I. Z., Misiuk, A., Gule, E. G., Shepeliavyi, P. E.
Published in Physica Status Solidi (b) (01.12.2008)
Published in Physica Status Solidi (b) (01.12.2008)
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Journal Article
Silicon nanoparticles in thermally annealed thin silicon monoxide films
Szekeres, A., Nikolova, T., Paneva, A., Cziraki, A., Kovacs, Gy. J., Lisovskyy, I., Mazunov, D., Indutnyy, I., Shepeliavyi, P.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (05.12.2005)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (05.12.2005)
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Journal Article
Interference lithography using chalcogenide inorganic photoresist
Indutnyy, I Z, Popescv, M, Lorin, A, Sava, F, Minko, V I, Shepeliavyi, P E
Published in Journal of Optoelectronics and Advanced Materials (01.12.2008)
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Published in Journal of Optoelectronics and Advanced Materials (01.12.2008)
Journal Article
VISIBLE PHOTOLUMINESCENCE FROM ANNEALED POROUS SiOx FILMS
Indutnyy, I Z, Maidanchuk, I Yu, Min'ko, V I, Shepeliavyi, P E, Dan'ko, V A
Published in Journal of Optoelectronics and Advanced Materials (01.06.2005)
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Published in Journal of Optoelectronics and Advanced Materials (01.06.2005)
Journal Article
SILICON CLUSTERS IN SILICON MONOXIDE FILMS
Szekeres, A, Nikolova, T, Paneva, A, Cziraki, A, Kovacs, Gy, Lisovskyy, I, Mazunov, D, Indutnyy, I, Shepeliavyi, P
Published in Journal of Optoelectronics and Advanced Materials (01.06.2005)
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Published in Journal of Optoelectronics and Advanced Materials (01.06.2005)
Journal Article
Structural-phase transformations in SiOx films in the course of vacuum heat treatment
Lisovskyy, I. P., Indutnyy, I. Z., Gnennyy, B. N., Lytvyn, P. M., Mazunov, D. O., Oberemok, A. S., Sopinskyy, N. V., Shepelyavyi, P. E.
Published in Semiconductors (Woodbury, N.Y.) (01.01.2003)
Published in Semiconductors (Woodbury, N.Y.) (01.01.2003)
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Journal Article
Inhomogeneous SiOx〈Fe〉 metal-dielectric films as a material for infrared thermal radiation detectors
Michailovskaya, E. V., Indutnyy, I. Z., Shepeliavyi, P. E.
Published in Technical physics (01.02.2003)
Published in Technical physics (01.02.2003)
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Journal Article
Gradient light-absorbing SiOx/Me coatings for display panels
Indutnyy, I. Z., Shepeliavyi, P. E., Michailovskaya, E. V., Park, C. W., Lee, J. B., Do, Y. R.
Published in Technical physics (01.06.2002)
Published in Technical physics (01.06.2002)
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Journal Article
Phase separation in SiO x films annealed under enhanced hydrostatic pressure
Rudko, G. Yu, Maidanchuk, I. Yu, Indutnyy, I. Z., Misiuk, A., Gule, E. G., Shepeliavyi, P. E.
Published in physica status solidi (b) (01.12.2008)
Published in physica status solidi (b) (01.12.2008)
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Journal Article
Ellipsometric characterization of SiOx films with embedded Si nanoparticles
Szekeres, A., Vlaikova, E., Lohner, T., Petrik, P., Huhn, G., Havancsak, K., Lisovskyy, I., Zlobin, S., Indutnyy, I.Z., Shepeliavyi, P.E.
Published in Vacuum (25.08.2009)
Published in Vacuum (25.08.2009)
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Journal Article
Ellipsometric characterization of SiO sub(x films with embedded Si nanoparticles)
Szekeres, A, Vlaikova, E, Lohner, T, Petrik, P, Huhn, G, Havancsak, K, Lisovskyy, I, Zlobin, S, Indutnyy, I Z, Shepeliavyi, P E
Published in Vacuum (25.08.2009)
Published in Vacuum (25.08.2009)
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Journal Article
Optical models for ellipsometric characterization of high temperature annealed nanostructured SiO(2) films
Lohner, T, Szekeres, A, Nikolova, T, Vlaikova, E, Petrik, P, Huhn, G, Havancsak, K, Lisovskyy, I, Zlobin, S, Indutnyy, I Z, Shepeliavyi, P E
Published in Journal of Optoelectronics and Advanced Materials (01.09.2009)
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Published in Journal of Optoelectronics and Advanced Materials (01.09.2009)
Journal Article
Recording of high efficiency diffraction gratings by He-Ne laser
Min'ko, V I, Shepeliavyi, P E, Dan'ko, V A, Romanenko, P F, Litvin, O S, Indutnyy, I Z
Published in Semiconductor physics, quantum electronics, and optoelectronics (01.01.2004)
Published in Semiconductor physics, quantum electronics, and optoelectronics (01.01.2004)
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