Internal and external stresses: In situ TEM compression of Cu bicrystals containing a twin boundary
Imrich, Peter J., Kirchlechner, Christoph, Kiener, Daniel, Dehm, Gerhard
Published in Scripta materialia (15.04.2015)
Published in Scripta materialia (15.04.2015)
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Journal Article
In Situ TEM Microcompression of Single and Bicrystalline Samples: Insights and Limitations
Imrich, Peter J., Kirchlechner, Christoph, Kiener, Daniel, Dehm, Gerhard
Published in JOM (1989) (01.08.2015)
Published in JOM (1989) (01.08.2015)
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Journal Article
Depth Dependence of Electron Channeling Contrast Imaging in Gallium Nitride
Lavallee, Etienne, Guitton, Antoine, Imrich, Peter, Chisholm, Claire
Published in BIO web of conferences (2024)
Published in BIO web of conferences (2024)
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Journal Article
Correlative, ML-based and non-destructive 3D-analysis of intergranular fatigue cracking in SAC305-Bi solder balls
Cui, Charlotte, Falah Chamasemani, Fereshteh, Paulachan, Priya, Sinojiya, Rahulkumar, Rosc, Jördis, Reisinger, Michael, Imrich, Peter, Hartner, Walter, Brunner, Roland
Published in Npj Materials degradation (20.04.2024)
Published in Npj Materials degradation (20.04.2024)
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Journal Article
In-situ TEM investigation of toughening in Silicon at small scales
Issa, Inas, Gammer, Christoph, Kolitsch, Stefan, Hohenwarter, Anton, Imrich, Peter J., Pippan, Reinhard, Kiener, Daniel
Published in Materials today (Kidlington, England) (01.09.2021)
Published in Materials today (Kidlington, England) (01.09.2021)
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Journal Article
Data-mining of in-situ TEM experiments: Towards understanding nanoscale fracture
Steinberger, Dominik, Issa, Inas, Strobl, Rachel, Imrich, Peter J., Kiener, Daniel, Sandfeld, Stefan
Published in Computational materials science (05.01.2023)
Published in Computational materials science (05.01.2023)
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Journal Article
Advanced nanomechanics in the TEM: effects of thermal annealing on FIB prepared Cu samples
Kiener, D., Zhang, Z., Šturm, S., Cazottes, S., Imrich, P.J., Kirchlechner, C., Dehm, G.
Published in Philosophical magazine (2003. Print) (01.09.2012)
Published in Philosophical magazine (2003. Print) (01.09.2012)
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Journal Article
Conference Proceeding
SpectraMiner, an interactive data mining and visualization software for single particle mass spectroscopy: A laboratory test case
Zelenyuk, Alla, Imre, Dan, Cai, Yong, Mueller, Klaus, Han, Yiping, Imrich, Peter
Published in International journal of mass spectrometry (01.12.2006)
Published in International journal of mass spectrometry (01.12.2006)
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Journal Article
Adhesion measurements of Polyimide to silicon nitride for semiconductor component applications
Hartleb, Moritz, Imrich, Peter, Zechner, Johannes, Walter, Thomas, Khatibi, Golta
Published in 2024 47th International Spring Seminar on Electronics Technology (ISSE) (15.05.2024)
Published in 2024 47th International Spring Seminar on Electronics Technology (ISSE) (15.05.2024)
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Conference Proceeding
Cross-sectional Nanoindentation: Applicability for testing Polyimide adhesion in semiconductor components
Hartleb, Moritz, Imrich, Peter, Zechner, Johannes, Walter, Thomas, Khatibi, Golta
Published in 2023 46th International Spring Seminar on Electronics Technology (ISSE) (10.05.2023)
Published in 2023 46th International Spring Seminar on Electronics Technology (ISSE) (10.05.2023)
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Conference Proceeding
Annealing Effects on the Structural Properties of FIB Prepared Cu Nanopillars - an in situ TEM study
Kiener, D., Zhang, Z., Sturm, S., Cazottes, S., Imrich, P.J., Kirchlechner, C., Dehm, G.
Published in Microscopy and microanalysis (01.08.2013)
Published in Microscopy and microanalysis (01.08.2013)
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Journal Article
Data-Mining of In-Situ TEM Experiments: Towards Understanding Nanoscale Fracture
Steinberger, Dominik, Issa, Inas, Strobl, Rachel, Imrich, Peter J, Kiener, Daniel, Sandfeld, Stefan
Year of Publication 22.06.2022
Year of Publication 22.06.2022
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Journal Article
Semiconductor device and method of producing a semiconductor device
Harrison, Mark, Behrendt, Andreas, Imrich, Peter, Beninger-Bina, Markus, Hartl, Robert, Lindner, Reinhard, Napetschnig, Evelyn
Year of Publication 15.11.2022
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Year of Publication 15.11.2022
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