Burst intensification by singularity emitting radiation in multi-stream flows
Pirozhkov, A. S., Esirkepov, T. Zh, Pikuz, T. A., Faenov, A. Ya, Ogura, K., Hayashi, Y., Kotaki, H., Ragozin, E. N., Neely, D., Kiriyama, H., Koga, J. K., Fukuda, Y., Sagisaka, A., Nishikino, M., Imazono, T., Hasegawa, N., Kawachi, T., Bolton, P. R., Daido, H., Kato, Y., Kondo, K., Bulanov, S. V., Kando, M.
Published in Scientific reports (21.12.2017)
Published in Scientific reports (21.12.2017)
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Soft-x-ray harmonic comb from relativistic electron spikes
Pirozhkov, A S, Kando, M, Esirkepov, T Zh, Gallegos, P, Ahmed, H, Ragozin, E N, Faenov, A Ya, Pikuz, T A, Kawachi, T, Sagisaka, A, Koga, J K, Coury, M, Green, J, Foster, P, Brenner, C, Dromey, B, Symes, D R, Mori, M, Kawase, K, Kameshima, T, Fukuda, Y, Chen, L, Daito, I, Ogura, K, Hayashi, Y, Kotaki, H, Kiriyama, H, Okada, H, Nishimori, N, Imazono, T, Kondo, K, Kimura, T, Tajima, T, Daido, H, Rajeev, P, McKenna, P, Borghesi, M, Neely, D, Kato, Y, Bulanov, S V
Published in Physical review letters (30.03.2012)
Published in Physical review letters (30.03.2012)
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Development of soft X-ray emission spectrometer for EPMA SEM and its application
Takahashi, H, Murano, T, Takakura, M, Asahina, S, Terauchi, M, Koike, M, Imazono, T, Koeda, M, Nagano, T
Published in IOP conference series. Materials Science and Engineering (09.02.2016)
Published in IOP conference series. Materials Science and Engineering (09.02.2016)
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Journal Article
Soft picosecond X-ray laser nanomodification of gold and aluminum surfaces
Starikov, S. V., Faenov, A. Ya, Pikuz, T. A., Skobelev, I. Yu, Fortov, V. E., Tamotsu, S., Ishino, M., Tanaka, M., Hasegawa, N., Nishikino, M., Kaihori, T., Imazono, T., Kando, M., Kawachi, T.
Published in Applied physics. B, Lasers and optics (2014)
Published in Applied physics. B, Lasers and optics (2014)
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Chemical States Analysis of Trace-boron by using an Improved SEM-SXES
Terauchi, M., Takahashi, H., Takakura, M., Murano, T., Koike, M., Imazono, T., Nagano, T., Sasai, H., Koeda, M.
Published in Microscopy and microanalysis (01.07.2016)
Published in Microscopy and microanalysis (01.07.2016)
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Soft X-ray Emission Spectroscopy on Chemical States of 3D-Transition Metal Elements with SEM
Terauchi, M., Takahashi, H., Murano, T., Imazono, T., Koike, M., Nagano, T., Koeda, M.
Published in Microscopy and microanalysis (01.08.2015)
Published in Microscopy and microanalysis (01.08.2015)
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Exciting Possibilities of Soft X-ray Emission Spectroscopy as Chemical State Analysis in EPMA and FESEM
Takahashi, H., Handa, N., Murano, T., Terauchi, M., Koike, M., Kawachi, T., Imazono, T., Hasegawa, N., Koeda, M., Nagano, T., Sasai, H., Oue, Y., Yonezawa, Z., Kuramoto, S.
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
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Surface nanodeformations caused by ultrashort laser pulse
Inogamov, N.A., Zhakhovsky, V.V., Ashitkov, S.I., Emirov, Yu.N., Faenov, A.Ya, Petrov, Yu.V., Khokhlov, V.A., Ishino, M., Demaske, B.J., Tanaka, M., Hasegawa, N., Nishikino, M., Tamotsu, S., Pikuz, T.A., Skobelev, I.Y., Ohba, T., Kaihori, T., Ochi, Y., Imazono, T., Fukuda, Y., Kando, M., Kato, Y., Kawachi, T., Anisimov, S.I., Agranat, M.B., Oleynik, I.I., Fortov, V.E.
Published in Engineering failure analysis (01.01.2015)
Published in Engineering failure analysis (01.01.2015)
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Laser ablation of gold: Experiment and atomistic simulation
Starikov, S. V., Stegailov, V. V., Norman, G. E., Fortov, V. E., Ishino, M., Tanaka, M., Hasegawa, N., Nishikino, M., Ohba, T., Kaihori, T., Ochi, E., Imazono, T., Kavachi, T., Tamotsu, S., Pikuz, T. A., Skobelev, I. Yu, Faenov, A. Ya
Published in JETP letters (01.08.2011)
Published in JETP letters (01.08.2011)
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Journal Article
Construction of a SXES spectrometer for a conventional SEM
Terauchi, M., Koshiya, S., Satoh, F., Takahashi, H., Handa, N., Murano, T., Koike, M., Imazono, T., Koeda, M., Nagano, T., Sasai, H., Oue, Y., Yonezawa, Z., Kuramoto, S.
Published in Microscopy and microanalysis (01.08.2013)
Published in Microscopy and microanalysis (01.08.2013)
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Journal Article
Present State of TEM-SXES Analysis and its Application to SEM aiming Chemical Analysis of Bulk Materials
Terauchi, M., Takahashi, H., Handa, N., Murano, T., Koike, M., Imazono, T., Koeda, M., Nagano, T., Sasai, H., Oue, Y., Yonezawa, Z., Kuramoto, S.
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
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Development of a flat-field spectrograph with a wide-band multilayer grating and prefocusing mirror covering 2-4 keV
Imazono, T, Koike, M, Hasegawa, N, Koeda, M, Nagano, T, Sasai, H, Oue, Y, Yonezawa, Z, Kuramoto, S, Terauchi, M, Takahashi, H, Handa, N, Murano, T
Published in Journal of physics. Conference series (22.03.2013)
Published in Journal of physics. Conference series (22.03.2013)
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Journal Article
Chemical State Mapping via Soft X-rays using a Wavelength Dispersive Soft X-ray Emission Spectrometer with High Energy Resolution
Takahashi, H., Handa, N., Murano, T., Terauchi, M., Koike, M., Imazono, T., Hasegawa, N., Koeda, M., Nagano, T., Sasai, H., Oue, Y., Yonezawa, Z., Kuramoto, S.
Published in Microscopy and microanalysis (01.08.2013)
Published in Microscopy and microanalysis (01.08.2013)
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Journal Article
Characteristics in valence-band emission spectra of simple metals and transition metals obtained by SXES-TEM
Terauchi, M., Takahashi, H., Handa, N., Murano, T., Koike, M., Kawachi, T., Imazono, T., Hasegawa, N., Koeda, M., Nagano, T., Sasai, H., Oue, Y., Yonezawa, Z., Kuramoto, S.
Published in Microscopy and microanalysis (01.07.2012)
Published in Microscopy and microanalysis (01.07.2012)
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Journal Article
An Extension up to 4 keV by a Newly Developed Multilayer-Coated Grating for TEM-SXES Spectrometer
Terauchi, M, Takahashi, H, Handa, N, Murano, T, Koike, M, Kawachi, T, Imazono, T, Hasagawa, N, Koeda, M, Nagano, T, Sasai, H, Oue, Y, Yonezawa, Z, Kuramoto, S
Published in Microscopy and microanalysis (01.07.2011)
Published in Microscopy and microanalysis (01.07.2011)
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Laminar and blazed type holographic gratings for a versatile soft x-ray spectrograph attached to an electron microscope and their evaluation in the 50-200 eV range
Imazono, Takashi, Koike, Masato, Kawachi, Tetsuya, Hasegawa, Noboru, Koeda, Masaru, Nagano, Tetsuya, Sasai, Hiroyuki, Oue, Yuki, Yonezawa, Zeno, Kuramoto, Satoshi, Terauchi, Masami, Takahashi, Hideyuki, Handa, Nobuo, Murano, Takanori, Sano, Kazuo
Published in Applied optics. Optical technology and biomedical optics (01.05.2012)
Published in Applied optics. Optical technology and biomedical optics (01.05.2012)
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Development of a flat-field spectrograph with a wide-hand multilayer grating and prefocusing mirror covering 2-4 keV
Imazono, T, Koike, M, Hasegawa, N, Koeda, M, Nagano, T, Sasai, H, Oue, Y, Yonezawa, Z, Kuramoto, S, Terauchi, M, Takahashi, H, Handa, N, Murano, T
Published in Journal of physics. Conference series (01.01.2013)
Published in Journal of physics. Conference series (01.01.2013)
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Journal Article
Development of soft X-ray multilayer laminar-type plane gratings and varied-line-spacing spherical grating for flat-field spectrograph in the 1–8 keV region
Koike, Masato, Ishino, Masahiko, Imazono, Takashi, Sano, Kazuo, Sasai, Hiroyuki, Hatayama, Masatoshi, Takenaka, Hisataka, Heimann, Philip A., Gullikson, Eric M.
Published in Spectrochimica acta. Part B: Atomic spectroscopy (01.08.2009)
Published in Spectrochimica acta. Part B: Atomic spectroscopy (01.08.2009)
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Journal Article
Li K-Emission Measurements Using a Newly Developed SXES-TEM Instrument
Terauchi, M, Takahashi, H, Handa, N, Murano, T, Koike, M, Kawachi, T, Imazono, T, Koeda, M, Nagano, T, Sasai, H, Oue, Y, Yonezawa, Z, Kuramoto, S
Published in Microscopy and microanalysis (01.07.2010)
Published in Microscopy and microanalysis (01.07.2010)
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Journal Article
A Soft X-ray Emission Specrometer with High-energy Resolution for Electron Probe Microanalysis
Takahashi, H, Handa, N, Murano, T, Terauchi, M, Koike, M, Kawachi, T, Imazono, T, Koeda, M, Nagano, T, Sasai, H, Oue, Y, Yonezawa, Z, Kuramoto, S
Published in Microscopy and microanalysis (01.07.2010)
Published in Microscopy and microanalysis (01.07.2010)
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