Organic-on-silicon complementary metal-oxide-semiconductor colour image sensors
Lim, Seon-Jeong, Leem, Dong-Seok, Park, Kyung-Bae, Kim, Kyu-Sik, Sul, Sangchul, Na, Kyoungwon, Lee, Gae Hwang, Heo, Chul-Joon, Lee, Kwang-Hee, Bulliard, Xavier, Satoh, Ryu-Ichi, Yagi, Tadao, Ro, Takkyun, Im, Dongmo, Jung, Jungkyu, Lee, Myungwon, Lee, Tae-Yon, Han, Moon Gyu, Jin, Yong Wan, Lee, Sangyoon
Published in Scientific reports (12.01.2015)
Published in Scientific reports (12.01.2015)
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Journal Article
7.9 1/2.74-inch 32Mpixel-Prototype CMOS Image Sensor with 0.64μ m Unit Pixels Separated by Full-Depth Deep-Trench Isolation
Park, JongEun, Park, Sungbong, Cho, Kwansik, Lee, Taehun, Lee, Changkyu, Kim, DongHyun, Lee, Beomsuk, Kim, SungIn, Ji, Ho-Chul, Im, DongMo, Park, Haeyong, Kim, Jinyoung, Cha, JungHo, Kim, Taehoon, Joe, In-Sung, Hong, Soojin, Chang, Chongkwang, Kim, Jingyun, Shim, WooGwan, Kim, Taehee, Lee, Jamie, Park, Donghyuk, Kim, EuiYeol, Park, Howoo, Lee, Jaekyu, Kim, Yitae, Ahn, JungChak, Hong, YoungKi, Jun, ChungSam, Kim, HyunChul, Moon, Chang-Rok, Kang, Ho-Kyu
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
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Conference Proceeding
6.10 A 1/1.56-inch 50Mpixel CMOS Image Sensor with 0.5μm pitch Quad Photodiode Separated by Front Deep Trench Isolation
Kim, DongHyun, Cho, Kwansik, Ji, Ho-Chul, Kim, Minkyung, Kim, Junghye, Kim, Taehoon, Seo, Seungju, Im, Dongmo, Lee, You-Na, Choi, Jinyong, Yoon, Sunghyun, Noh, Inho, Kim, Jinhyung, Lee, Khang June, Jung, Hyesung, Shin, Jongyoon, Hur, Hyuk, Chang, Kyoung Eun, Cho, Incheol, Woo, Kieyoung, Moon, Byung Seok, Kim, Jameyung, Ahn, Yeonsoo, Sim, Dahee, Park, Sungbong, Lee, Wook, Kim, Kooktae, Chang, Chong Kwang, Yoon, Hansik, Kim, Juha, Kim, Sung-In, Kim, Hyunchul, Moon, Chang-Rok, Song, Jaihyuk
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)
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Conference Proceeding
5.5 A 2.1e− Temporal Noise and −105dB Parasitic Light Sensitivity Backside-Illuminated 2.3µm-Pixel Voltage-Domain Global Shutter CMOS Image Sensor Using High-Capacity DRAM Capacitor Technology
Lee, Jae-Kyu, Kim, Seung Sik, Baek, In-Gyu, Shim, Heesung, Kim, Taehoon, Kim, Taehyoung, Kyoung, Jungchan, Im, Dongmo, Choi, Jinyong, Cho, KeunYeong, Kim, Daehoon, Lim, Haemin, Seo, Min-Woong, Kim, JuYoung, Kwon, Doowon, Song, Jiyoun, Kim, Jiyoon, Jang, Minho, Moon, Joosung, Kim, HyunChul, Chang, Chong Kwang, Kim, JinGyun, Koh, Kyoungmin, Lim, HanJin, Ahn, JungChak, Hong, Hyeongsun, Lee, Kyupil, Kang, Ho-Kyu
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
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Conference Proceeding
Image sensor and method of manufacturing the same
Kwon, Seokjin, Lee, Kwang-Min, Lee, Beomsuk, Im, Dongmo, Park, Hyeyun
Year of Publication 26.04.2022
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Year of Publication 26.04.2022
Patent
Image sensor and driving method thereof
Lee, Jaekyu, Im, Dongmo, Cho, Dongseok, Seo, Minwoong, Kim, Seungsik, Ahn, Jungchak
Year of Publication 01.06.2021
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Year of Publication 01.06.2021
Patent
Image sensor and method of manufacturing the same
Kwon, Seokjin, Lee, Kwang-Min, Lee, Beomsuk, Im, Dongmo, Park, Hyeyun
Year of Publication 12.05.2020
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Year of Publication 12.05.2020
Patent
Image sensor
Kwon, Seokjin, Lee, Kwang-Min, Lee, GwideokRyan, Lee, Beomsuk, Im, Dongmo, Lee, Taeyon
Year of Publication 23.07.2019
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Year of Publication 23.07.2019
Patent
IMAGE SENSOR AND METHOD OF MANUFACTURING THE SAME
Kwon, Seokjin, Lee, Kwang-Min, Lee, Beomsuk, Im, Dongmo, Park, Hyeyun
Year of Publication 05.07.2018
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Year of Publication 05.07.2018
Patent