by HARDY, E, IHS, H, DUFAZA, C, MEILLERE, S, BOUCHAKOUR, R
Published in Electronics letters (26.05.2011)

by Dufaza, C., IHS, H.
Published in Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) (1997)

by Arabi, K., Ihs, H., Dufaza, C., Kaminska, B.
Published in Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) (1998)

by Hardy, E, Ihs, H, Dufaza, C, Meillère, S, Bouchakour, R
Published in Electronics letters (26.05.2011)

by Ihs, H., Dufaza, C.
Published in European Design and Test Conference: Proceedings of the 1997 European conference on Design and Test; 17-20 Mar. 1997 (17.03.1997)

by H. SUSUMU,H. IHS
Year of Publication 19.04.2006

by Dufaza, C., Ihs, H., Verzijp, N.
Published in Proceedings of Third International Conference on Electronics, Circuits, and Systems (1996)

by Hardy, E., Ihs, H., Dufaza, C., Meillere, S., Bouchakour, R.
Published in 2011 IEEE Custom Integrated Circuits Conference (CICC) (01.09.2011)

by Hassan, I.H.S., Arabi, K., Kaminska, B.
Published in Proceedings International Conference on Computer Design. VLSI in Computers and Processors (Cat. No.98CB36273) (1998)

by H. SUSUMU, H. IHS
Year of Publication 07.01.2004

by Ihs, H., Dufaza, C.
Published in Proceedings of the Fourth Asian Test Symposium (1995)

by Ihs, H., Dufaza, C.
Published in Proceedings European Design and Test Conference. ED & TC 97 (1997)