Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection
Vyas, Pratik B., Pimparkar, Ninad, Tu, Robert, Arfaoui, Wafa, Bossu, Germain, Siddabathula, Mahesh, Lehmann, Steffen, Goo, Jung-Suk, Icel, Ali B.
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
Test structures to quantify contact placement-impacted drain current variations
Topaloglu, Rasit O, Zhi-Yuan Wu, Icel, Ali B
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2010)
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2010)
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Conference Proceeding
Extending two-element capacitance extraction method toward ultraleaky gate oxides using a short-channel length
Jung-Suk Goo, Mantei, T., Wieczorek, K., En, W.G., Icel, A.B.
Published in IEEE electron device letters (01.12.2004)
Published in IEEE electron device letters (01.12.2004)
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Journal Article
Bridging design and manufacture of analog/mixed-signal circuits in advanced CMOS
Jia Feng, Loke, A. L. S., Tin Tin Wee, Lackey, C. O., Okada, L. A., Schwan, C. T., Mantei, T., Morgan, J. H., Herden, M. M., Cooper, J. G., Zhi-Yuan Wu, Jung-Suk Goo, Xin Li, Icel, A. B., Bair, L. A., Fischette, D. M., Doyle, B. A., Fang, E. S., Leary, B. M., Krishnan, S.
Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
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Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
Conference Proceeding
Switching-mode dependence of inductive noise in VLSI power bus lines
Jung-Suk Goo, Hale, S., Zamudio, L., Pelella, M.M., Klein, R., Butler, S., Judy Xilin An, Lee, M., Icel, A.B.
Published in IEEE electron device letters (01.05.2004)
Published in IEEE electron device letters (01.05.2004)
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Journal Article
Impact of stress on various circuit characteristics in 65nm PDSOI technology
Suryagandh, S., Gupta, M., Zhi-Yuan Wu, Krishnan, S., Pelella, M., Jung-Suk Goo, Thuruthiyil, C., An, J.X., Chen, B.Q., Subba, N., Zamudio, L., Yonemura, J., Icel, A.B.
Published in ESSCIRC 2007 - 33rd European Solid-State Circuits Conference (01.09.2007)
Published in ESSCIRC 2007 - 33rd European Solid-State Circuits Conference (01.09.2007)
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Conference Proceeding
Impact of stress on various circuit characteristics in 65nm PDSOI technology
Suryagandh, S., Gupta, M., Zhi-Yuan Wu, Krishnan, S., Pelella, M., Jung-Suk Goo, Thuruthiyil, C., An, J.X., Chen, B.Q., Subba, N., Zamudio, L., Yonemura, J., Icel, A.B.
Published in ESSDERC 2007 - 37th European Solid State Device Research Conference (01.09.2007)
Published in ESSDERC 2007 - 37th European Solid State Device Research Conference (01.09.2007)
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Conference Proceeding
Off-state leakage current modeling in low-power/high-performance partially-depleted (PD) floating-body (FB) SOI MOSFETs
Qiang Chen, Jung-Suk Goo, Tran Ly, Chandrasekaran, K., Zhi-Yuan Wu, Thuruthiyil, C., Icel, A.B.
Published in 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (01.10.2008)
Published in 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (01.10.2008)
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Conference Proceeding
Critical current (ICRIT) based SPICE model extraction for SRAM cell
Qiang Chen, Balasubramanian, S., Thuruthiyil, C., Gupta, M., Wason, V., Subba, N., Jung-Suk Goo, Chiney, P., Krishnan, S., Icel, A.B.
Published in 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (01.10.2008)
Published in 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (01.10.2008)
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Conference Proceeding
Extraction of speculative SOI MOSFET models using self-heating-free targets
Qiang Chen, Zhi-Yuan Wu, Ly, T., Gupta, M., Wason, V., Jung-Suk Goo, Thuruthiyil, C., Radwin, M., Subba, N., Chiney, P., Suryagandh, S., Icel, A.B.
Published in 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (01.10.2008)
Published in 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (01.10.2008)
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Conference Proceeding
History-effect-conscious SPICE model extraction for PD-SOI technology
Goo, J.-S., An, J.X., Thuruthiyil, C., Ly, T., Chen, Q., Radwin, M., Zhi-Yuan Wu, Lee, M.S.L., Zamudio, L., Yonemura, J., Assad, F., Pelella, M.M., Icel, A.B.
Published in 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) (2004)
Published in 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) (2004)
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Conference Proceeding