Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics
Gorfman, S, Simons, H, Iamsasri, T, Prasertpalichat, S, Cann, D P, Choe, H, Pietsch, U, Watier, Y, Jones, J L
Published in Scientific reports (11.02.2016)
Published in Scientific reports (11.02.2016)
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