Gate-Bias-Induced Threshold Voltage Shifts in GaN FATFETs
Irokawa, Yoshihiro, Mitsuishi, Kazutaka, Izumi, Takatomi, Nishii, Junya, Nabatame, Toshihide, Koide, Yasuo
Published in ECS journal of solid state science and technology (01.05.2023)
Published in ECS journal of solid state science and technology (01.05.2023)
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Journal Article
Nonvolatile SRAM based on Phase Change
Takata, M., Nakayama, K., Izumi, T., Shinmura, T., Akita, J., Kitagawa, A.
Published in 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop (2006)
Published in 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop (2006)
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Conference Proceeding