Prediction of the fatigue fracture of a bolt by ultrasonic flaw detection
HAGIWARA, Masaya, IWATA, Hisafumi, FUJINO, Yousuke, YOSHIMOTO, Isamu
Published in JSME international journal (1987)
Published in JSME international journal (1987)
Get full text
Journal Article
INSPECTION SYSTEM AND METHOD FOR PRODUCING ELECTRONIC DEVICE BY USING THE SAME
ONO, MAKOTO, IWATA, HISAFUMI, KONISHI, JUNKO, YOSHITAKE, YASUHIRO, MORIOKA, NATSUYO, IKEDA, YOUKO, NEMOTO, KAZUNORI
Year of Publication 16.03.2000
Get full text
Year of Publication 16.03.2000
Patent
Accuracy of yield impact calculation based on kill ratio
Ono, M., Iwata, H., Watanabe, K.
Published in 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 (Cat. No.02CH37259) (2002)
Published in 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 (Cat. No.02CH37259) (2002)
Get full text
Conference Proceeding
BONDING METHOD OF TAB INNER LEADS AND APPARATUS THEREOF
TANAKA, HIROYUKI, TAKAHASHI, MICHIO, SUGIMOTO, KOICHI, HAMADA, TOSHIMITSU, SAKAI, TOSHIHIKO, MATSUKAWA, KEIZO, IWATA, HISAFUMI, MITA, TOORU, NAKAGAWA, YASUO, SERIZAWA, KOUJI, MIMATA, TSUTOMU, KANETA, AIZO
Year of Publication 29.03.1993
Get full text
Year of Publication 29.03.1993
Patent