MEASURING SYSTEM ESPECIALY FOR ANALOGUE AND ANALOGUE-TO-DIGITAL INTEGRATED CIRCUITS TESTING
NIEDERLAND VLADIMIR ,CS, IVANCO MILAN ,CS, MARETTA VENDELIN ,CS, LIBICHER JAN ,CS, STELLA JIRI ,CS, LATTA JAN ,CS, KUNIAK JURAJ ,CS, SLIPKA JAROSLAV CSC.,CS, KONTSEK LUBOMIR RNDR.,CS
Year of Publication 12.02.1991
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Year of Publication 12.02.1991
Patent