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Year of Publication 26.07.2018
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Year of Publication 25.09.1997
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Year of Publication 31.03.2015
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Year of Publication 23.04.2013
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Year of Publication 07.06.2012
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Method for inspecting defect and system therefor
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Year of Publication 07.07.2009
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In-line wafer inspection data warehouse for automated defect limited yield analysis
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