Atomic-Scale Electrical Field Mapping of Hexagonal Boron Nitride Defects
Cretu, Ovidiu, Ishizuka, Akimitsu, Yanagisawa, Keiichi, Ishizuka, Kazuo, Kimoto, Koji
Published in ACS nano (23.03.2021)
Published in ACS nano (23.03.2021)
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Journal Article
Atomic number dependence of Z contrast in scanning transmission electron microscopy
Yamashita, Shunsuke, Kikkawa, Jun, Yanagisawa, Keiichi, Nagai, Takuro, Ishizuka, Kazuo, Kimoto, Koji
Published in Scientific reports (17.08.2018)
Published in Scientific reports (17.08.2018)
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Journal Article
Element-selective imaging of atomic columns in a crystal using STEM and EELS
Kimoto, Koji, Asaka, Toru, Nagai, Takuro, Saito, Mitsuhiro, Matsui, Yoshio, Ishizuka, Kazuo
Published in Nature (29.11.2007)
Published in Nature (29.11.2007)
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Journal Article
Extremely low count detection for EELS spectrum imaging by reducing CCD read-out noise
Haruta, Mitsutaka, Fujiyoshi, Yoshifumi, Nemoto, Takashi, Ishizuka, Akimitsu, Ishizuka, Kazuo, Kurata, Hiroki
Published in Ultramicroscopy (01.12.2019)
Published in Ultramicroscopy (01.12.2019)
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Journal Article
Direct observation and dynamics of spontaneous skyrmion-like magnetic domains in a ferromagnet
Nagao, Masahiro, So, Yeong-Gi, Yoshida, Hiroyuki, Isobe, Masaaki, Hara, Toru, Ishizuka, Kazuo, Kimoto, Koji
Published in Nature nanotechnology (01.05.2013)
Published in Nature nanotechnology (01.05.2013)
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Journal Article
Boundary-artifact-free determination of potential distribution from differential phase contrast signals
Ishizuka, Akimitsu, Oka, Masaaki, Seki, Takehito, Shibata, Naoya, Ishizuka, Kazuo
Published in Microscopy (01.12.2017)
Published in Microscopy (01.12.2017)
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Journal Article
Quantitative annular dark-field imaging of single-layer graphene
Yamashita, Shunsuke, Koshiya, Shogo, Ishizuka, Kazuo, Kimoto, Koji
Published in Microscopy (01.04.2015)
Published in Microscopy (01.04.2015)
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Journal Article
Evaluation of Crystal Lattice Rotation around a Stress-Induced Twin in a Step-Graded SiGe / Si (110) Using STEM Moiré Observation and its Image Analysis
Yamanaka, Junji, Yamamoto, Chiaya, Shirakura, Mai, Hara, Kosuke O., Arimoto, Keisuke, Nakagawa, Kiyokazu, Ishizuka, Akimitsu, Ishizuka, Kazuo
Published in Microscopy and microanalysis (01.08.2019)
Published in Microscopy and microanalysis (01.08.2019)
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Journal Article
Quantitative annular dark-field imaging of single-layer graphene-II: atomic-resolution image contrast
Yamashita, Shunsuke, Koshiya, Shogo, Nagai, Takuro, Kikkawa, Jun, Ishizuka, Kazuo, Kimoto, Koji
Published in Microscopy (01.12.2015)
Published in Microscopy (01.12.2015)
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Assessment of lower-voltage TEM performance using 3D Fourier transform of through-focus series
Kimoto, Koji, Kurashima, Keiji, Nagai, Takuro, Ohwada, Megumi, Ishizuka, Kazuo
Published in Ultramicroscopy (01.10.2012)
Published in Ultramicroscopy (01.10.2012)
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Quantitative evaluation of temporal partial coherence using 3D Fourier transforms of through-focus TEM images
Kimoto, Koji, Sawada, Hidetaka, Sasaki, Takeo, Sato, Yuta, Nagai, Takuro, Ohwada, Megumi, Suenaga, Kazu, Ishizuka, Kazuo
Published in Ultramicroscopy (01.11.2013)
Published in Ultramicroscopy (01.11.2013)
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