Measurement of the high-temperature Seebeck coefficient of thin films by means of an epitaxially regrown thermometric reference material
Ramu, Ashok T, Mages, Phillip, Zhang, Chong, Imamura, Jeffrey T, Bowers, John E
Published in Review of scientific instruments (01.09.2012)
Published in Review of scientific instruments (01.09.2012)
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Journal Article
IMAGER VERIFICATION SYSTEMS AND METHODS
Fairfield, Nile E, Tauber, Sean, Hansen, Randy J, Judd, Kelsey M, Imamura, Jeffrey
Year of Publication 27.04.2023
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Year of Publication 27.04.2023
Patent
IMAGER VERIFICATION SYSTEMS AND METHODS
TAUBER, Sean, HANSEN, Randy J, IMAMURA, Jeffrey, JUDD, Kelsey M, FAIRFIELD, Nile E
Year of Publication 30.12.2021
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Year of Publication 30.12.2021
Patent