by Yu-Hsin Chen, Krishna, Tushar, Emer, Joel S., Sze, Vivienne
Published in IEEE journal of solid-state circuits (01.01.2017)

by Yin, Shihui, Jiang, Zhewei, Seo, Jae-Sun, Seok, Mingoo
Published in IEEE journal of solid-state circuits (01.06.2020)

by Sadhu, Bodhisatwa, Tousi, Yahya, Hallin, Joakim, Sahl, Stefan, Reynolds, Scott K., Renstrom, Orjan, Sjogren, Kristoffer, Haapalahti, Olov, Mazor, Nadav, Bokinge, Bo, Weibull, Gustaf, Bengtsson, Hakan, Carlinger, Anders, Westesson, Eric, Thillberg, Jan-Erik, Rexberg, Leonard, Yeck, Mark, Xiaoxiong Gu, Ferriss, Mark, Duixian Liu, Friedman, Daniel, Valdes-Garcia, Alberto
Published in IEEE journal of solid-state circuits (01.12.2017)

by Jiang, Zhewei, Yin, Shihui, Seo, Jae-Sun, Seok, Mingoo
Published in IEEE journal of solid-state circuits (01.07.2020)

by Kibaroglu, Kerim, Sayginer, Mustafa, Rebeiz, Gabriel M
Published in IEEE journal of solid-state circuits (01.05.2018)

by Biswas, Avishek, Chandrakasan, Anantha P.
Published in IEEE journal of solid-state circuits (01.01.2019)

by Patra, Bishnu, Incandela, Rosario M., van Dijk, Jeroen P. G., Homulle, Harald A. R., Lin Song, Shahmohammadi, Mina, Staszewski, Robert Bogdan, Vladimirescu, Andrei, Babaie, Masoud, Sebastiano, Fabio, Charbon, Edoardo
Published in IEEE journal of solid-state circuits (01.01.2018)

by Jintao Zhang, Zhuo Wang, Verma, Naveen
Published in IEEE journal of solid-state circuits (01.04.2017)

by Wang, Yun, Wu, Rui, Pang, Jian, You, Dongwon, Fadila, Ashbir Aviat, Saengchan, Rattanan, Fu, Xi, Matsumoto, Daiki, Nakamura, Takeshi, Kubozoe, Ryo, Kawabuchi, Masaru, Liu, Bangan, Zhang, Haosheng, Qiu, Junjun, Liu, Hanli, Oshima, Naoki, Motoi, Keiichi, Hori, Shinichi, Kunihiro, Kazuaki, Kaneko, Tomoya, Shirane, Atsushi, Okada, Kenichi
Published in IEEE journal of solid-state circuits (01.05.2020)

by Valavi, Hossein, Ramadge, Peter J., Nestler, Eric, Verma, Naveen
Published in IEEE journal of solid-state circuits (01.06.2019)

by Lee, Jinmook, Kim, Changhyeon, Kang, Sanghoon, Shin, Dongjoo, Kim, Sangyeob, Yoo, Hoi-Jun
Published in IEEE journal of solid-state circuits (01.01.2019)

by SungWon Chung, Abediasl, Hooman, Hashemi, Hossein
Published in IEEE journal of solid-state circuits (01.01.2018)

by Fatemi, Reza, Khachaturian, Aroutin, Hajimiri, Ali
Published in IEEE journal of solid-state circuits (01.05.2019)

by Tang, Xiyuan, Shen, Linxiao, Kasap, Begum, Yang, Xiangxing, Shi, Wei, Mukherjee, Abhishek, Pan, David Z., Sun, Nan
Published in IEEE journal of solid-state circuits (01.04.2020)

by Pang, Jian, Wu, Rui, Wang, Yun, Dome, Masato, Kato, Hisashi, Huang, Hongye, Tharayil Narayanan, Aravind, Liu, Hanli, Liu, Bangan, Nakamura, Takeshi, Fujimura, Takuya, Kawabuchi, Masaru, Kubozoe, Ryo, Miura, Tsuyoshi, Matsumoto, Daiki, Li, Zheng, Oshima, Naoki, Motoi, Keiichi, Hori, Shinichi, Kunihiro, Kazuaki, Kaneko, Tomoya, Shirane, Atsushi, Okada, Kenichi
Published in IEEE journal of solid-state circuits (01.05.2019)

by Lee, Sangyeop, Hara, Shinsuke, Yoshida, Takeshi, Amakawa, Shuhei, Dong, Ruibing, Kasamatsu, Akifumi, Sato, Junji, Fujishima, Minoru
Published in IEEE journal of solid-state circuits (01.12.2019)

by Hamada, Hiroshi, Tsutsumi, Takuya, Matsuzaki, Hideaki, Fujimura, Takuya, Abdo, Ibrahim, Shirane, Atsushi, Okada, Kenichi, Itami, Go, Song, Ho-Jin, Sugiyama, Hiroki, Nosaka, Hideyuki
Published in IEEE journal of solid-state circuits (01.09.2020)

by Jia, Hongyang, Valavi, Hossein, Tang, Yinqi, Zhang, Jintao, Verma, Naveen
Published in IEEE journal of solid-state circuits (01.09.2020)

by Kim, Taehwan, Ngai, Tat, Timalsina, Yukta, Watts, Michael R., Stojanovic, Vladimir, Bhargava, Pavan, Poulton, Christopher V., Notaros, Jelena, Yaacobi, Ami, Timurdogan, Erman, Baiocco, Christopher, Fahrenkopf, Nicholas, Kruger, Seth
Published in IEEE journal of solid-state circuits (01.11.2019)

by Si, Xin, Liu, Rui, Yu, Shimeng, Liu, Ren-Shuo, Hsieh, Chih-Cheng, Tang, Kea-Tiong, Li, Qiang, Chang, Meng-Fan, Chen, Jia-Jing, Tu, Yung-Ning, Huang, Wei-Hsing, Wang, Jing-Hong, Chiu, Yen-Cheng, Wei, Wei-Chen, Wu, Ssu-Yen, Sun, Xiaoyu
Published in IEEE journal of solid-state circuits (01.01.2020)