Search Results - "IEEE International Conference on Microelectronic Test Structures, 1992" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Three-dimensional effects of latchup turn-on CMOS and forward-biased n super(+)-diode measured by photoemission

Three-dimensional effects of latchup turn-on CMOS and forward-biased n super(+)-diode measured by photoemission

by Ohzone, Takashi, Iwata, Hideyuki
Published in IEEE International Conference on Microelectronic Test Structures, 1992 (01.01.1992)

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Journal Article

Two-dimensional current/voltage measurements of reverse-biased n super(+)-diodes by photoemission

Two-dimensional current/voltage measurements of reverse-biased n super(+)-diodes by photoemission

by Ohzone, Takashi, Iwata, Hideyuki
Published in IEEE International Conference on Microelectronic Test Structures, 1992 (01.01.1992)

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Journal Article

Proceedings of the 1992 International Conference on Microelectronic Test Structures - ICMTS 92

Proceedings of the 1992 International Conference on Microelectronic Test Structures - ICMTS 92

by Anon
Published in IEEE International Conference on Microelectronic Test Structures, 1992 (01.01.1992)

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Journal Article

An analytical strategy for fast extraction of MOS transistor DC parameters applied to the SPICE MOS3 and BSIM models

An analytical strategy for fast extraction of MOS transistor DC parameters applied to the SPICE MOS3 and BSIM models

by Karlsson, Peter R, Jeppson, Kjell O
Published in Proceedings of the International Conference on Microelectronic Test Structures ICMTS (01.01.1992)

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Journal Article Conference Proceeding

The use of a digital multiplexer to reduce process control chip pad count

The use of a digital multiplexer to reduce process control chip pad count

by Ward, D., Walton, A.J., Gammie, W.G., Holwill, R.J.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

A new method and test structure for easy determination of femto-farad on-chip capacitances in a MOS process

A new method and test structure for easy determination of femto-farad on-chip capacitances in a MOS process

by Laquai, B., Richter, H., Hofflinger, B.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

An investigation of MOSFET statistical and temperature effects

An investigation of MOSFET statistical and temperature effects

by Power, J.A., Clancy, R., Wall, W.A., Mathewson, A., Lane, W.A.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

Test structures and measurement techniques for the characterization of the dynamic behaviour of CMOS transistors on wafer in the GHz range

Test structures and measurement techniques for the characterization of the dynamic behaviour of CMOS transistors on wafer in the GHz range

by Hanseler, J., Schinagel, H., Zapf, H.L.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

New failure analysis technique of ULSIs using photon emission method

New failure analysis technique of ULSIs using photon emission method

by Uraoka, Y., Maeda, T., Miyanaga, I., Tsuji, K.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

Voltage-dividing potentiometer enhancements for high-precision feature placement metrology

Voltage-dividing potentiometer enhancements for high-precision feature placement metrology

by Allen, R.A., Cresswell, M.W., Ellenwood, C.H., Linholm, L.W.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

Automatic test chip and test program generation: an approach to parametric test computer-aided design

Automatic test chip and test program generation: an approach to parametric test computer-aided design

by Ternisien d'Ouville, T., Jeanne, J.P., Leclercq, J.L., Caloud, D., Zangara, L.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

Test structure for the detection, localization and identification of short circuits with a high speed digital tester

Test structure for the detection, localization and identification of short circuits with a high speed digital tester

by Hess, C., Weiland, L.H.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

Critical dimension measurements by electron and optical beams for the establishment of linewidth standards

Critical dimension measurements by electron and optical beams for the establishment of linewidth standards

by Hatsuzawa, T., Toyoda, K.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

A new latch-up test structure for practical design methodology for internal circuits in the standard cell-based CMOS/BiCMOS LSIs

A new latch-up test structure for practical design methodology for internal circuits in the standard cell-based CMOS/BiCMOS LSIs

by Aoki, T.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

A novel test structure for monitoring technological mismatches in DRAM processes

A novel test structure for monitoring technological mismatches in DRAM processes

by Geib, H., Weber, W., Wohlrab, E., Risch, L.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

Suppression of measurement errors in effective-MOSFET-channel-length extraction

Suppression of measurement errors in effective-MOSFET-channel-length extraction

by Terada, K.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

Life time evaluation of MOSFET in ULSIs using photon emission method

Life time evaluation of MOSFET in ULSIs using photon emission method

by Tsutsu, N., Uraoka, Y., Morii, T., Tsuji, K.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

Test structures for ISFET chemical sensors

Test structures for ISFET chemical sensors

by Gracia, I., Cane, C., Lozano, M., Esteve, J.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

Effective channel length determination using punchthrough voltage

Effective channel length determination using punchthrough voltage

by Nakanishi, S., Hoijer, M., Saitoh, Y., Katoh, Y., Kojima, Y., Kamiya, M.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article

Finite element analysis of a SWEAT structure with a 3-D, nonlinear, coupled thermal-electric model

Finite element analysis of a SWEAT structure with a 3-D, nonlinear, coupled thermal-electric model

by Dion, M.J.
Published in ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures (1992)

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Conference Proceeding Journal Article