Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies
Zhao, Yujie, Katoh, Kentaroh, Kuwana, Anna, Katayama, Shogo, Wei, Jianglin, Kobayashi, Haruo, Nakatani, Takayuki, Hatayama, Kazumi, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu
Published in Journal of electronic testing (01.02.2022)
Published in Journal of electronic testing (01.02.2022)
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Journal Article
High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST
Sato, Keno, Nakatani, Takayuki, Katayama, Shogo, Iimori, Daisuke, Ogihara, Gaku, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Zhao, Yujie, Katoh, Kentaroh, Kuwana, Anna, Hatayama, Kazumi, Kobayashi, Haruo
Published in 2022 IEEE 31st Asian Test Symposium (ATS) (01.11.2022)
Published in 2022 IEEE 31st Asian Test Symposium (ATS) (01.11.2022)
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Conference Proceeding
Accurate Testing of Precision Voltage Reference by DC-AC Conversion
Sato, Keno, Nakatani, Takayuki, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Kuwana, Anna, Hatayama, Kazumi, Kobayashi, Haruo
Published in 2020 IEEE 29th Asian Test Symposium (ATS) (23.11.2020)
Published in 2020 IEEE 29th Asian Test Symposium (ATS) (23.11.2020)
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Conference Proceeding
Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer
Iimori, Daisuke, Nakatani, Takayuki, Katayama, Shogo, Ogihara, Gaku, Hatta, Akemi, Kuwana, Anna, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Wei, Jianglin, Zhao, Yujie, Tran, Tri Minh, Hatayama, Kazumi, Kobayashi, Haruo
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
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Conference Proceeding
Evaluation of Null Method for Operational Amplifier Short-Time Testing
Aoki, Riho, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Katayama, Shogo, Sasaki, Yuto, Machida, Kosuke, Nakatani, Takayuki, Wang, Jianlong, Kuwana, Anna, Hatayama, Kazumi, Kobayashi, Haruo
Published in 2019 IEEE 13th International Conference on ASIC (ASICON) (01.10.2019)
Published in 2019 IEEE 13th International Conference on ASIC (ASICON) (01.10.2019)
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Conference Proceeding
Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production
Ogihara, Gaku, Nakatani, Takayuki, Iimori, Daisuke, Katayama, Shogo, Kuwana, Anna, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Zhao, Yujie, Wei, Jianglin, Hatayama, Kazumi, Kobayashi, Haruo
Published in 2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS) (28.11.2021)
Published in 2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS) (28.11.2021)
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Conference Proceeding
Analog/Mixed-Signal Circuit Testing Technologies in IoT Era
Kobayashi, Haruo, Kuwana, Anna, Wei, Jianglin, Zhao, Yujie, Katayama, Shogo, Tri, Tran Minh, Hirai, Manato, Nakatani, Takayuki, Hatayama, Kazumi, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu
Published in 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) (03.11.2020)
Published in 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) (03.11.2020)
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Conference Proceeding
Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion
Sasaki, Yuto, Ichikawa, Tamotsu, Kuwana, Anna, Hatayama, Kazumi, Kobayashi, Haruo, Machida, Kosuke, Aoki, Riho, Katayama, Shogo, Nakatani, Takayuki, Wang, Jianlong, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki
Published in 2019 IEEE International Test Conference in Asia (ITC-Asia) (01.09.2019)
Published in 2019 IEEE International Test Conference in Asia (ITC-Asia) (01.09.2019)
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Conference Proceeding
A/D CONVERTER TEST DEVICE, TEST METHOD, AND SEMICONDUCTOR DEVICE
KOBAYASHI HARUO, OKAMOTO TOMOYUKI, ICHIKAWA TAMOTSU, SATO MASAO, ISHIDA TAKASHI
Year of Publication 18.03.2021
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Year of Publication 18.03.2021
Patent
Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion
Sato, Keno, Nakatani, Takayuki, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Katayama, Shogo, Iimori, Daiske, Takagi, Misaki, Zhao, Yujie, Yamamoto, Shuhei, Kuwana, Anna, Katoh, Kentaroh, Hatayama, Kazumi, Kobayashi, Haruo
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
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Conference Proceeding
METHOD OF MAINTAINING NATURAL TURF FOR STADIUM
ICHIKAWA TAMOTSU, HIRANO AKIMASA, KAWAGUCHI MASATO, KATO KEISUKE, OIKAWA NAOYA
Year of Publication 13.02.2020
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Year of Publication 13.02.2020
Patent
VOLTAGE MEASUREMENT DEVICE AND DEVICE WITH SENSOR
KOBAYASHI HARUO, OKAMOTO TOMOYUKI, ICHIKAWA TAMOTSU, SATO MASAO, NAKATANI TAKAYUKI, ISHIDA TAKASHI
Year of Publication 18.03.2021
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Year of Publication 18.03.2021
Patent
High Precision Measurement of Sub-Nano Ampere Current in ATE Environment
Sato, Keno, Nakatani, Takayuki, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Katayama, Shogo, Ogihara, Gaku, Iimori, Daisuke, Zhao, Yujie, Wei, Jianglin, Kuwana, Anna, Hatayama, Kazumi, Kobayashi, Haruo
Published in 2021 IEEE 30th Asian Test Symposium (ATS) (01.11.2021)
Published in 2021 IEEE 30th Asian Test Symposium (ATS) (01.11.2021)
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Conference Proceeding
Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies
Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Wei, Jianglin, Nakatani, Takayuki, Zhao, Yujie, Katayama, Shogo, Yamamoto, Shuhei, Kuwana, Anna, Hatayama, Kazumi, Kobayashi, Haruo
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
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Conference Proceeding
Innovative Practices Track: Innovative Analog Circuit Testing Technologies
Mangelsdorf, Chris, Madhvaraj, Manasa, Mir, Salvador, Barragan, Manuel, Iimori, Daisuke, Nakatani, Takayuki, Katayama, Shogo, Ogihara, Gaku, Zhao, Yujie, Wei, Jianglin, Kuwana, Anna, Katoh, Kentaroh, Hatayama, Kazumi, Kobayashi, Haruo, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding
Consideration on Input Signal for ADC Histogram Test in Short Time
Kuwana, Anna, Du, Yuan Yang, Kobayashi, Haruo, Hatayama, Kazumi, Zhao, Yujie, Nakatani, Takayuki, Ozawa, Yuki, Ichikawa, Tamotsu, Ishida, Takashi, Sato, Keno, Okamoto, Toshiyuki, Sasaki, Yuto
Published in Advanced engineering forum (01.11.2020)
Published in Advanced engineering forum (01.11.2020)
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Journal Article
High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm
Wei, Jiang-Lin, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Kushita, Nene, Arai, Takahiro, Sha, Lei, Kuwana, Anna, Kobayashi, Haruo, Nakatani, Takayuki, Hatayama, Kazumi, Sato, Keno
Published in 2019 IEEE 13th International Conference on ASIC (ASICON) (01.10.2019)
Published in 2019 IEEE 13th International Conference on ASIC (ASICON) (01.10.2019)
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Conference Proceeding
Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers
Ogihara, Gaku, Nakatani, Takayuki, Hatta, Akemi, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Kuwana, Anna, Aoki, Riho, Katayama, Shogo, Wei, Jianglin, Zhao, Yujie, Wang, Jianlong, Hatayama, Kazumi, Kobayashi, Haruo
Published in 2020 IEEE 29th Asian Test Symposium (ATS) (23.11.2020)
Published in 2020 IEEE 29th Asian Test Symposium (ATS) (23.11.2020)
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Conference Proceeding
Innovative Test Practices in Japan
Asada, Yusuke, Shimizu, Takahiko, Gendai, Yuji, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Wei, Jiang-Lin, Kushita, Nene, Arai, Hirotaka, Kuwana, Anna, Nakatani, Takayuki, Hatayama, Kazumi, Kobayashi, Haruo
Published in 2019 IEEE 37th VLSI Test Symposium (VTS) (01.04.2019)
Published in 2019 IEEE 37th VLSI Test Symposium (VTS) (01.04.2019)
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Conference Proceeding