Graphene Interconnect Lifetime: A Reliability Analysis
Xiangyu Chen, Seo, D. H., Sunae Seo, Hyunjong Chung, Wong, H.-S Philip
Published in IEEE electron device letters (01.11.2012)
Published in IEEE electron device letters (01.11.2012)
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Journal Article
Graphene interconnect lifetime under high current stress
Xiangyu Chen, Seo, D. H., Sunae Seo, Hyunjong Chung, Wong, H. P.
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)
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Conference Proceeding