Effects of social network services (SNS) subjective norms on SNS addiction
Kim, Joon-ho, Kim, Goon-ju, Choi, Hyun-ju, Seok, Bong-ihn, Lee, Nam-hyun
Published in Journal of psychology in Africa (02.11.2019)
Published in Journal of psychology in Africa (02.11.2019)
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Journal Article
Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM
Lee, Nam-Hyun, Kim, Jongkyun, Son, Donghee, Kim, Kangjun, Seok, Jung Eun
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Method of estimating mechanical stress on Si body of MOSFET using drain-body junction current
Seo, Ji-Hoon, Kim, Gang-Jun, Son, Donghee, Lee, Nam-Hyun, Kang, Bongkoo
Published in Japanese Journal of Applied Physics (01.01.2017)
Published in Japanese Journal of Applied Physics (01.01.2017)
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Journal Article
Factors of regular sponsorship of African children: A cross-ethnic study
Kim, Jae-kyeong, Kwon, June-hyuk, Lee, Nam-hyun, Choi, Hyun-ju, Jung, Seung-hye, Lee, Hyuck-jin, Kim, Joon-ho
Published in Journal of psychology in Africa (02.11.2018)
Published in Journal of psychology in Africa (02.11.2018)
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Journal Article
Effect of dynamic stress on off leakage of small-dimension pMOSFETs at high temperature
Kim, Gang-Jun, Seo, Ji-Hoon, Son, Donghee, Lee, Nam-Hyun, Kang, YoungHa, Hwang, YuChul, Kang, Bongkoo
Published in Japanese Journal of Applied Physics (01.04.2014)
Published in Japanese Journal of Applied Physics (01.04.2014)
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Journal Article
Experimental Method to Extract Effective Channel Length of Nanoscale n-MOSFETs
LEE, Nam-Hyun, CHOI, Hwan-Wook, KANG, Heesung, KANG, Bongkoo
Published in IEEE electron device letters (01.11.2009)
Published in IEEE electron device letters (01.11.2009)
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Journal Article
Effect of DC/AC stress on the reliability of cell capacitor in DRAM
Kim, Gang-Jun, Lee, Nam-Hyun, Kim, Jongkyun, Seok, Jung Eun, Lee, Yunsung
Published in Microelectronics and reliability (01.09.2018)
Published in Microelectronics and reliability (01.09.2018)
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Journal Article
Effects of film thickness and Sn concentration on electrical properties of solution-processed zinc tin oxide thin film transistors
Kim, CheolGyu, Lee, Nam-Hyun, Kwon, Young-Kyu, Kang, Bongkoo
Published in Thin solid films (01.10.2013)
Published in Thin solid films (01.10.2013)
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Journal Article
Conference Proceeding
Channel width dependence of AC stress on bulk nMOSFETs
Son, Donghee, Kim, Gang-Jun, Seo, Ji-Hoon, Lee, Nam-Hyun, Kang, YongHa, Kang, Bongkoo
Published in Microelectronics and reliability (01.09.2016)
Published in Microelectronics and reliability (01.09.2016)
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Journal Article
Degradation of pMOSFETs due to hot electron induced punchthrough
Son, Donghee, Kim, Gang-Jun, Seo, Ji-Hoon, Lee, Nam-Hyun, Kang, YongHa, Kang, Bongkoo
Published in Microelectronics and reliability (01.04.2016)
Published in Microelectronics and reliability (01.04.2016)
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Journal Article
Vision-based motion planning for an autonomous motorcycle on ill-structured roads
Song, Dezhen, Lee, Hyun Nam, Yi, Jingang, Levandowski, Anthony
Published in Autonomous robots (01.10.2007)
Published in Autonomous robots (01.10.2007)
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Journal Article
Impact of Dynamic Stress on Reliability of Nanoscale n-Channel Metal--Oxide--Semiconductor Field-Effect Transistors with SiON Gate Dielectric Operating in a Complementary Metal--Oxide--Semiconductor Inverter at Elevated Temperature
Lee, Nam-Hyun, Kim, Hyung-wook, Kang, Bongkoo
Published in Japanese Journal of Applied Physics (01.02.2012)
Published in Japanese Journal of Applied Physics (01.02.2012)
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Journal Article
Effects of AlN buffer layers on the structural and the optical properties of GaN epilayers grown on Al2O3 substrates by using plasma-assisted molecular beam epitaxy
Jeon, Hee Chang, Lee, Seung Joo, Kumar, Sunil, Kang, Tae Won, Lee, Nam Hyun, Kim, Tae Whan
Published in Journal of the Korean Physical Society (01.04.2014)
Published in Journal of the Korean Physical Society (01.04.2014)
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Journal Article