Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip
Houdellier, F., de Knoop, L., Gatel, C., Masseboeuf, A., Mamishin, S., Taniguchi, Y., Delmas, M., Monthioux, M., Hÿtch, M.J., Snoeck, E.
Published in Ultramicroscopy (01.04.2015)
Published in Ultramicroscopy (01.04.2015)
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Journal Article
Dynamical effects in strain measurements by dark-field electron holography
Javon, E., Lubk, A., Cours, R., Reboh, S., Cherkashin, N., Houdellier, F., Gatel, C., Hÿtch, M.J.
Published in Ultramicroscopy (01.12.2014)
Published in Ultramicroscopy (01.12.2014)
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Journal Article
Mapping stress and strain in nanostructures by high-resolution transmission electron microscopy
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Conference Proceeding
Quantitative local strain measurements in compressive strained Ge/tensile strained Si bi-layers grown on top of relaxed Si0.5Ge0.5 virtual substrates
Cherkashin, N., Hÿtch, M.J., Snoeck, E., Hüe, F., Hartmann, J.M., Bogumilowicz, Y., Claverie, A.
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.12.2006)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.12.2006)
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Journal Article
Quantitative strain and stress measurements in Ge/Si dual channels grown on a Si0.5Ge0.5 virtual substrate
Cherkashin, N., Hÿtch, M.J., Snoeck, E., Claverie, A., Hartmann, J.M., Bogumilowicz, Y.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (01.12.2005)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (01.12.2005)
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Journal Article
Control of grain size and morphologies of nanograined ferrites by adaptation of the synthesis route: mechanosynthesis and soft chemistry
Guigue-Millot, N., Bégin-Colin, S., Champion, Y., Hÿtch, M.J., Le Caër, G., Perriat, P.
Published in Journal of solid state chemistry (2003)
Published in Journal of solid state chemistry (2003)
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Journal Article
Quantitative method of assessing the nature of local order from HREM images for SRO on crystalline sublattices
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Journal Article
Conference Proceeding
Single quantum well deep-green LEDs with buried InGaN/GaN short-period superlattice
Lundin, W.V., Nikolaev, A.E., Sakharov, A.V., Zavarin, E.E., Valkovskiy, G.A., Yagovkina, M.A., Usov, S.O., Kryzhanovskaya, N.V., Sizov, V.S., Brunkov, P.N., Zakgeim, A.L., Cherniakov, A.E., Cherkashin, N.A., Hytch, M.J., Yakovlev, E.V., Bazarevskiy, D.S., Rozhavskaya, M.M., Tsatsulnikov, A.F.
Published in Journal of crystal growth (15.01.2011)
Published in Journal of crystal growth (15.01.2011)
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Tests on the validity of the atomic column approximation for STEM probe propagation
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Journal Article
Conference Proceeding
Analysis of mismatched heterointerfaces by combined HREM image processing and modelling
Möbus, G., Levay, A., Inkson, B.J., Hÿtch, M.J., Trampert, A., Wagner, T.
Published in International journal of materials research (03.02.2022)
Published in International journal of materials research (03.02.2022)
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Journal Article
Optimization of off-axis electron holography performed with femtosecond electron pulses
Houdellier, F., Caruso, G.M., Weber, S., Hÿtch, M.J., Gatel, C., Arbouet, A.
Published in Ultramicroscopy (01.07.2019)
Published in Ultramicroscopy (01.07.2019)
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Journal Article
Optical and structural properties of InGaN/GaN short-period superlattices for the active region of light- emitting diodes
Kryzhanovskaya, N. V., Lundin, W. V., Nikolaev, A. E., Tsatsul’nikov, A. F., Sakharov, A. V., Pavlov, M. M., Cherkachin, N. A., Hÿtch, M. J., Valkovsky, G. A., Yagovkina, M. A., Usov, S. O.
Published in Semiconductors (Woodbury, N.Y.) (01.06.2010)
Published in Semiconductors (Woodbury, N.Y.) (01.06.2010)
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Journal Article
The use of short-period InGaN/GaN superlattices in blue-region light-emitting diodes
Sizov, V. S., Tsatsulnikov, A. F., Sakharov, A. V., Lundin, W. V., Zavarin, E. E., Cherkashin, N. A., Hÿtch, M. J., Nikolaev, A. E., Mintairov, A. M., He, Yan, Merz, J. L.
Published in Semiconductors (Woodbury, N.Y.) (01.07.2010)
Published in Semiconductors (Woodbury, N.Y.) (01.07.2010)
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Journal Article
Quantitative 3D electromagnetic field determination of 1D nanostructures from single projection
Phatak, C., Knoop, L. de, Houdellier, F., Gatel, C., Hÿtch, M.J., Masseboeuf, A.
Published in Ultramicroscopy (01.05.2016)
Published in Ultramicroscopy (01.05.2016)
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