Novel Approach for the Reduction of Leakage Current Characteristics of 20 nm DRAM Capacitors With ZrO2-Based High-k Dielectrics
Jong-Min Lee, Dong-Sik Park, Seung-chul Yew, Soo-Ho Shin, Jun-Yong Noh, Hyoung-Sub Kim, Byoung-Deog Choi
Published in IEEE electron device letters (01.11.2017)
Published in IEEE electron device letters (01.11.2017)
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Journal Article
2.45 e-RMS Low-Random-Noise, 598.5 mW Low-Power, and 1.2 kfps High-Speed 2-Mp Global Shutter CMOS Image Sensor With Pixel-Level ADC and Memory
Seo, Min-Woong, Chu, Myunglae, Jung, Hyun-Yong, Kim, Suksan, Song, Jiyoun, Bae, Daehee, Lee, Sanggwon, Lee, Junan, Kim, Sung-Yong, Lee, Jongyeon, Kim, Minkyung, Lee, Gwi-Deok, Shim, Heesung, Um, Changyong, Kim, Changhwa, Baek, In-Gyu, Kwon, Doowon, Kim, Hongki, Choi, Hyuksoon, Go, Jonghyun, Ahn, Jungchak, Lee, Jae-Kyu, Moon, Chang-Rok, Lee, Kyupil, Kim, Hyoung-Sub
Published in IEEE journal of solid-state circuits (01.04.2022)
Published in IEEE journal of solid-state circuits (01.04.2022)
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Journal Article
Risk factor analysis of postoperative kyphotic change in subaxial cervical alignment after upper cervical fixation
Kim, Hyoung-Sub, Lee, Jong Beom, Park, Jong Hyeok, Lee, Ho Jin, Lee, Jung Jae, Dutta, Shumayou, Kim, Il Sup, Hong, Jae Taek
Published in Journal of neurosurgery. Spine (01.08.2019)
Published in Journal of neurosurgery. Spine (01.08.2019)
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Journal Article
Investigation of transient relaxation under static and dynamic stress in Hf-based gate oxides
Akbar, M.S., Changhwan Choi, Se Jong Rhee, Krishnan, S.A., Chang Yong Kang, Man Hong Zhang, Tackhwi Lee, Ok, I., Feng Zhu, Hyoung-Sub Kim, Lee, J.C.
Published in IEEE transactions on electron devices (01.05.2006)
Published in IEEE transactions on electron devices (01.05.2006)
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Journal Article
Hafnium Titanate bilayer structure multimetal dielectric nMOSCAPs
Se Jong Rhee, Feng Zhu, Hyoung-Sub Kim, Chang Hwan Choi, Chang Yong Kang, Manhong Zhang, Tackhwi Lee, Ok, I., Krishnan, S.A., Lee, J.C.
Published in IEEE electron device letters (01.04.2006)
Published in IEEE electron device letters (01.04.2006)
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Journal Article
New Method for Reduction of the Capacitor Leakage Failure Rate Without Changing the Capacitor Structure or Materials in DRAM Mass Production
Lee, Jong-Min, Choi, Pyung-Ho, Kim, Soon-Kon, Oh, Jung-Hwan, Shin, Soo-Ho, Noh, Jun-Yong, Kim, Hyoung-Sub, Choi, Byoung-Deog
Published in IEEE transactions on electron devices (01.11.2018)
Published in IEEE transactions on electron devices (01.11.2018)
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Journal Article
Metal Gate-HfO2 MOS structures on GaAs substrate with and without Si interlayer
OK, Injo, KIM, Hyoung-Sub, LEE, Jack C, MANHONG ZHANG, KANG, Chang-Yong, SE JONG RHEE, CHOI, Changhwan, KRISHNAN, Siddarth A, LEE, Tackhwi, FENG ZHU, THAREJA, Gaurav
Published in IEEE electron device letters (01.03.2006)
Published in IEEE electron device letters (01.03.2006)
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Journal Article
Extraordinarily Long-Term PosttraumaticCerebrospinal Fluid Fistula
Hyoung Sub Kim, Jin Woo Hur, Jong Won Lee, Hyun Koo Lee
Published in Journal of Korean Neurosurgical Society (01.11.2007)
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Published in Journal of Korean Neurosurgical Society (01.11.2007)
Journal Article
Highly reliable polysilicon oxide grown by electron cyclotron resonance nitrous oxide plasma
Lee, Nae-In, Lee, Jin-Woo, Hur, Sung-Hoi, Kim, Hyoung-Sub, Han, Chul-Hi
Published in IEEE electron device letters (01.10.1997)
Published in IEEE electron device letters (01.10.1997)
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Journal Article
Structural advantage for the EOT scaling and improved electron channel mobility by incorporating dysprosium oxide (Dy2O3) into HfO2 n-MOSFETs
LEE, Tackhwi, SE JONG RHEE, LEE, Jack C, CHANG YONG KANG, FENG ZHU, KIM, Hyoung-Sub, CHOI, Changhwan, OK, Injo, MANHONG ZHANG, KRISHNAN, Siddarth, THAREJA, Gaurav
Published in IEEE electron device letters (01.08.2006)
Published in IEEE electron device letters (01.08.2006)
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Journal Article
Chip package interaction in micro bump and TSV structure
Ha-Young You, Yuchul Hwang, Jung-Woo Pyun, Young-Gyun Ryu, Hyoung-Sub Kim
Published in 2012 IEEE 62nd Electronic Components and Technology Conference (01.05.2012)
Published in 2012 IEEE 62nd Electronic Components and Technology Conference (01.05.2012)
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Conference Proceeding
Effects of nodule treatment of rolled copper on the mechanical properties of the flexible copper-clad laminate
Lee, Chang-Yong, Lee, Jae-Hong, Choi, Don-Hyun, Lee, Hoo-Jeong, Kim, Hyoung-Sub, Jung, Seung-Boo, Moon, Won-Chul
Published in Microelectronic engineering (01.11.2007)
Published in Microelectronic engineering (01.11.2007)
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Journal Article
Conference Proceeding
Aggressively scaled ultrathin undoped HfO2 gate dielectric (EOT < 0.7 nm) with TaN gate electrode using engineered interface layer
CHOI, Changhwan, KANG, Chang-Yong, LEE, Jack C, SE JONG RHEE, AKBAR, Mohammad Shahariar, KRISHNAN, Siddarth A, MANHONG ZHANG, KIM, Hyoung-Sub, LEE, Tackhwi, OK, Injo, FENG ZHU
Published in IEEE electron device letters (01.07.2005)
Published in IEEE electron device letters (01.07.2005)
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Journal Article
A 2.6 e-rms Low-Random-Noise, 116.2 mW Low-Power 2-Mp Global Shutter CMOS Image Sensor with Pixel-Level ADC and In-Pixel Memory
Seo, Min-Woong, Chu, Myunglae, Jung, Hyun-Yong, Kim, Suksan, Song, Jiyoun, Lee, Junan, Kim, Sung-Yong, Lee, Jongyeon, Byun, Sung-Jae, Bae, Daehee, Kim, Minkyung, Lee, Gwi-Deok, Shim, Heesung, Um, Changyong, Kim, Changhwa, Baek, In-Gyu, Kwon, Doowon, Kim, Hongki, Choi, Hyuksoon, Go, Jonghyun, Ahn, JungChak, Lee, Jaekyu, Moon, Changrok, Lee, Kyupil, Kim, Hyoung-Sub
Published in 2021 Symposium on VLSI Circuits (13.06.2021)
Published in 2021 Symposium on VLSI Circuits (13.06.2021)
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Conference Proceeding
Room Temperature Control and Fire Alarm/Suppression IoT Service Using MQTT on AWS
Kang, Do-Hun, Park, Min-Sung, Kim, Hyoung-Sub, Kim, Da-young, Kim, Sang-Hui, Son, Hyeon-Ju, Lee, Sang-Gon
Published in 2017 International Conference on Platform Technology and Service (PlatCon) (01.02.2017)
Published in 2017 International Conference on Platform Technology and Service (PlatCon) (01.02.2017)
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Conference Proceeding
Extraordinarily long-term posttraumatic cerebrospinal fluid fistula
Kim, Hyoung Sub, Hur, Jin Woo, Lee, Jong Won, Lee, Hyun Koo
Published in Journal of Korean Neurosurgical Society (01.11.2007)
Published in Journal of Korean Neurosurgical Society (01.11.2007)
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Journal Article
Structural advantage for the EOT scaling and improved electron channel mobility by incorporating dysprosium oxide (Dy/sub 2/O/sub 3/) into HfO/sub 2/ n-MOSFETs
Tackhwi Lee, Se Jong Rhee, Chang Yong Kang, Feng Zhu, Hyoung-sub Kim, Changhwan Choi, Ok, I., Manhong Zhang, Krishnan, S., Thareja, G., Lee, J.C.
Published in IEEE electron device letters (01.08.2006)
Published in IEEE electron device letters (01.08.2006)
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Journal Article