Layout Dependent Effect Analysis and Modeling for Comprehensive, Practical Layout Patterns in 18nm FDSOI Technology
Lim, Dongwoo, Choo, Hyotae, Song, Jooyoung, Lee, Sungjae
Published in 2024 IEEE European Solid-State Electronics Research Conference (ESSERC) (09.09.2024)
Published in 2024 IEEE European Solid-State Electronics Research Conference (ESSERC) (09.09.2024)
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Conference Proceeding
Characterization and analysis of gate-induced-drain-leakage current in 45 nm CMOS technology
Xiaobin Yuan, Jae-Eun Park, Jing Wang, Enhai Zhao, Ahlgren, D., Hook, T., Jun Yuan, Chan, V., Huiling Shang, Chu-Hsin Liang, Lindsay, R., Sungjoon Park, Hyotae Choo
Published in 2007 IEEE International Integrated Reliability Workshop Final Report (01.10.2007)
Published in 2007 IEEE International Integrated Reliability Workshop Final Report (01.10.2007)
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Conference Proceeding
Variable capacitor circuit and digitally-controlled oscillator including the same
Choo, Hyotae, Lee, Somin, Choi, Yongchang, Park, Hyoeun, Park, Sungjoon, An, Youngchang
Year of Publication 13.06.2023
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Year of Publication 13.06.2023
Patent
VARIABLE CAPACITOR CIRCUIT AND DIGITALLY-CONTROLLED OSCILLATOR INCLUDING THE SAME
Choo, Hyotae, Lee, Somin, Choi, Yongchang, Park, Hyoeun, Park, Sungjoon, An, Youngchang
Year of Publication 29.09.2022
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Year of Publication 29.09.2022
Patent
Gate-Induced-Drain-Leakage Current in 45-nm CMOS Technology
Xiaobin Yuan, Jae-Eun Park, Jing Wang, Enhai Zhao, Ahlgren, D.C., Hook, T., Jun Yuan, Chan, V., Huiling Shang, Chu-Hsin Liang, Lindsay, R., Sungjoon Park, Hyotae Choo
Published in IEEE transactions on device and materials reliability (01.09.2008)
Published in IEEE transactions on device and materials reliability (01.09.2008)
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Magazine Article