Machine learning investigation of high-k metal gate processes for dynamic random access memory peripheral transistor
Kwon, Namyong, Bang, JoonHo, Sung, Won Ju, Han, Jung Hoon, Lee, Dongin, Jung, Ilwoo, Park, Se Guen, Ban, Hyodong, Hwang, Sangjoon, Shin, Won Yong, Bae, Jinhye, Lee, Dongwoo
Published in APL materials (01.02.2024)
Published in APL materials (01.02.2024)
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Journal Article
Improvement of VRT immunity using low 10-boron word line in recent DRAM
Jang, Dongkyu, Kim, Daekyum, Lee, Jieun, Lee, Inkyum, Ahn, Sang Bin, Hong, Yoonki, Kim, Shindeuk, Park, Taehoon, Ban, Hyodong
Published in Microelectronics and reliability (01.06.2024)
Published in Microelectronics and reliability (01.06.2024)
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Journal Article
Analysis of Intermittent Single-bit Failure on 10-nm node generation DRAM Devices
Seo, Hyewon, Rim, Taiuk, Lee, Eunsun, Jang, Sekyoung, Chae, Kyosuk, Oh, Jeonghoon, Ban, Hyodong, Lee, Jooyoung
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Interface Engineering of Trench-Ox for Modern DRAM Devices
Hwang, Soojung, Kim, Jongkyu, Kim, Juntae, Cha, Dahyun, Kim, Minho, Jang, Dongkyu, Cho, Sunghak, Kim, Seokhyang, Park, Jaeseong, Kim, Hyungjoon, Yu, Sukwon, Song, Boyoung, Ban, Hyodong
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
A 16-Gb T-Coil-Based GDDR6 DRAM With Merged-MUX TX, Optimized WCK Operation, and Alternative-Data-Bus Achieving 27-Gb/s/Pin in NRZ
Lee, Daewoong, Baek, Jaehyeok, Kwon, Hye-Jung, Kwon, Dae-Hyun, Cho, Chulhee, Kim, Sang-Hoon, An, Donggun, Chang, Chulsoon, Lim, Unhak, Im, Jiyeon, Sung, Wonju, Kim, Hye-Ran, Park, Sun-Young, Kim, Hyoung-Joo, Seol, Hoseok, Kim, Juhwan, Shin, Jungbum, Kang, Gil-Young, Kim, Yong-Hun, Kim, Sooyoung, Park, Wansoo, Kim, Seok-Jung, Lee, Chan-Yong, Lee, Seungseob, Park, Tae-Hoon, Oh, Chi-Sung, Ban, Hyodong, Ko, Hyungjong, Song, Hoyoung, Oh, Tae-Young, Hwang, Sang-Joon, Oh, Kyung-Suk, Choi, Jung-Hwan, Lee, Jooyoung
Published in IEEE journal of solid-state circuits (01.01.2023)
Published in IEEE journal of solid-state circuits (01.01.2023)
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Journal Article
Investigation on NBTI Control Techniques of HKMG Transistors for Low-power DRAM applications
Sung, Won Ju, Kim, Hyun Seung, Han, Jung Hoon, Park, Se Guen, Oh, Jeong-Hoon, Ban, Hyodong, Lee, Jooyoung
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Enhanced DRAM Single Bit Characteristics from Process Control of Chlorine
Rim, Taiuk, Che, Kyosuk, Kwon, Sehyun, Lee, Jin-Seong, Oh, Jeonghoon, Ban, Hyodong, Lee, Jooyoung
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
14nm DRAM Development and Manufacturing
Kim, Kanguk, Son, Youngwoo, Ryu, Hoin, Lee, Byunghyun, Kim, Jooncheol, Shin, Hyunsu, Kang, Joonyoung, Kim, Jihun, Jeong, Shinwoo, Chae, Kyosuk, Lee, Dongkak, Jung, Ilwoo, Kim, Yongkwan, Song, Boyoung, Oh, Jeonghoon, Song, Jungwoo, Park, Seguen, Lee, Keumjoo, Ban, Hyodong, Kim, Jiyoung, Lee, Jooyoung
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
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Conference Proceeding
A 16Gb 27Gb/s/pin T-coil based GDDR6 DRAM with Merged-MUX TX, Optimized WCK Operation, and Alternative-Data-Bus
Lee, Daewoong, Kwon, Hye-Jung, Kwon, Daehyun, Baek, Jaehyeok, Cho, Chulhee, Kim, Sanghoon, An, Donggun, Chang, Chulsoon, Lim, Unhak, Im, Jiyeon, Sung, Wonju, Kim, Hye-Ran, Park, Sun-Young, Kim, HyoungJoo, Seol, Hoseok, Kim, Juhwan, Shin, Junabum, Kang, Kil-Youna, Kim, Yona-Hun, Kim, Sooyoung, Park, Wansoo, Kim, Seok-Jung, Lee, Chanyong, Lee, Seungseob, Park, TaeHoon, Oh, ChiSung, Ban, Hyodong, Ko, Hyungjong, Song, Hoyoung, Oh, Tae-Young, Hwang, SangJoon, Oh, Kyung Suk, Choi, JungHwan, Lee, Jooyoung
Published in 2022 IEEE International Solid- State Circuits Conference (ISSCC) (20.02.2022)
Published in 2022 IEEE International Solid- State Circuits Conference (ISSCC) (20.02.2022)
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Conference Proceeding
13.6 A 16Gb 37Gb/s GDDR7 DRAM with PAM3-Optimized TRX Equalization and ZQ Calibration
Cho, Sung-Yong, Choi, Moon-Chul, Baek, Jaehyeok, An, Donggun, Kim, Sanghoon, Lee, Daewoong, Yang, Seongyeal, Kang, Gil-Young, Park, Juseop, Lee, Kyungho, Jung, Hwan-Chul, Cho, Gunhee, Lee, Chanyong, Kim, Hye-Ran, Shin, Yong-Jae, Park, Hanna, Lee, Sangyong, Kim, Jonghyuk, Won, Bokyeon, Mok, Jungil, Kim, Kijin, Lim, Unhak, Jin, Hong-Jun, Lee, YoungSeok, Kim, Young-Tae, Ha, Heonjoo, Ahn, Jinchan, Sung, Wonju, Jang, Yoontaek, Song, Hoyoung, Ban, Hyodong, Park, TaeHoon, Oh, Tae-Young, Yoo, Changsik, Hwang, SangJoon
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)
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Conference Proceeding
SEMICONDUCTOR DEVICE INCLUDING CONTACT PLUG
HA, Daegwon, KIM, Minwoo, BAN, Hyodong, SONG, Jungwoo, KIM, Jinyong, GU, Bonhong
Year of Publication 13.04.2023
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Year of Publication 13.04.2023
Patent
Stress-induced leakage current comparison of giga-bit scale DRAM capacitors with OCS (one-cylinder-storage) node
Donggun Park, Hyodong Ban, Semin Jung, Hungmo Yang, Wonshik Lee
Published in 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) (2000)
Published in 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) (2000)
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Conference Proceeding