Noise Improvement of a-Si Microbolometers by the Post-Metal Annealing Process
Oh, Jaesub, Song, Hyeong-sub, Park, Jongcheol, Lee, Jong-Kwon
Published in Sensors (Basel, Switzerland) (10.10.2021)
Published in Sensors (Basel, Switzerland) (10.10.2021)
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Journal Article
Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of p-MOSFETs
Kwon, Sung-Kyu, Kwon, Hyuk-Min, Han, In-Shik, Jang, Jae-Hyung, Oh, Sun-Ho, Song, Hyeong-Sub, Park, Byoung-Seok, Chung, Yi-Sun, Lee, Jung-Hwan, Kim, Si-Bum, Lee, Ga-Won, Lee, Hi-Deok
Published in IEEE journal of the Electron Devices Society (01.01.2018)
Published in IEEE journal of the Electron Devices Society (01.01.2018)
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Journal Article
Identification of Interface States and Shallow and Deep Hole Traps under NBTI Stress using Fast, Normal, and Charge-pumping Measurement Techniques
Kwon, Sung-Kyu, Oh, Sun-Ho, Song, Hyeong-Sub, Kim, So-Yeong, Lee, Ga-Won, Lee, Hi-Deok
Published in Journal of semiconductor technology and science (01.04.2018)
Published in Journal of semiconductor technology and science (01.04.2018)
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Journal Article
Analysis of Anomalously Large RTS Noise Amplitudes in Tunneling Field-effect Transistors
Kim, So-Yeong, Oh, Dong-Jun, Kwon, Sung-Kyu, Song, Hyeong-Sub, Lim, Dong-Hwan, Choi, Chang-Hwan, Lee, Ga-Won, Lee, Hi-Deok
Published in Journal of semiconductor technology and science (01.04.2018)
Published in Journal of semiconductor technology and science (01.04.2018)
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Journal Article
Critical role of thulium metal interlayer in ultra-low contact resistance reduction in Ni-InGaAs/n-InGaAs for n-MOSFETs
Eadi, Sunil Babu, Lee, Jeong Chan, Song, Hyeong-Sub, Oh, Jungwoo, Lee, Hi-Deok
Published in Vacuum (01.08.2019)
Published in Vacuum (01.08.2019)
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Journal Article
Surface-Potential-Based Analytical Model of Low-Frequency Noise for Planar-Type Tunnel Field-Effect Transistors
Park, Yeong-Hun, Yi, Boram, Kim, Seung-Hwan, Shim, Ju-Hyun, Song, Hyeong-Sub, Song, Hyun-Dong, Shin, Hyun-Jin, Lee, Hi-Deok, Yang, Ji-Woon
Published in IEEE transactions on electron devices (01.08.2021)
Published in IEEE transactions on electron devices (01.08.2021)
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Journal Article
Improved reduction of contact resistance in NiSi/Si junction using Holmium interlayer
Eadi, Sunil Babu, Song, Hyeong-Sub, Song, Hyun-dong, Oh, Jungwoo, Lee, Hi-Deok
Published in Microelectronic engineering (15.01.2020)
Published in Microelectronic engineering (15.01.2020)
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Journal Article
Decrease of Parasitic Capacitance for Improvement of RF Performance of Multi-finger MOSFETs in 90-nm CMOS Technology
Jang, Seong-Yong, Kwon, Sung-Kyu, Shin, Jong-Kwan, Yu, Jae-Nam, Oh, Sun-Ho, Jeong, Jin-Woong, Song, Hyeong-Sub, Kim, Choul-Young, Lee, Ga-Won, Lee, Hi-Deok
Published in Journal of semiconductor technology and science (01.04.2015)
Published in Journal of semiconductor technology and science (01.04.2015)
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Journal Article
Improvement in NO2 Gas Sensing Performance Using Igzo Film Sensor
Eadi, Sunil Babu, Jeong, Jun-Kyo, Song, Hyeong-Sub, Lee, Ga-Won, Lee, Hi-Deok
Published in ECS transactions (24.04.2020)
Published in ECS transactions (24.04.2020)
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Journal Article
Experimental optimization of post metal annealing on fully depleted-silicon on insulator tunneling field effect transistor
Song, Hyun-Dong, Song, Hyeong-Sub, Eadi, Sunil Babu, Choi, Hyun-Woong, Shin, Hyun-Jin, Lee, Jae Woo, Yang, Ji-Woon, Lee, Hi-Deok
Published in Japanese Journal of Applied Physics (01.07.2020)
Published in Japanese Journal of Applied Physics (01.07.2020)
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Journal Article
Correlation between low-frequency noise and interface traps of fully-depleted silicon-on-insulator tunneling FETs induced by hot carrier stress
Shin, Hyun-Jin, Song, Hyun-Dong, Song, Hyeong-Sub, Eadi, Sunil Babu, Choi, Hyun-Woong, Kim, Seong-Hyun, Kim, Do-Woo, Lee, Hi-Deok, Kwon, Hyuk-Min
Published in Japanese Journal of Applied Physics (01.10.2020)
Published in Japanese Journal of Applied Physics (01.10.2020)
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Journal Article
Test Structures for Noise Reduction of Fully Depleted-Silicon on Insulator p-Type Tunneling FET Using Channel Orientation
Song, Hyun-Dong, Song, Hyeong-Sub, Eadi, Sunil Babu, Choi, Hyun-Woong, Lee, Ga-Won, Lee, Hi-Deok
Published in 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) (01.05.2020)
Published in 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) (01.05.2020)
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Conference Proceeding
Investigation of Random Telegraph Noise Characteristics with Intentional Hot Carrier Aging
Song, Hyeong-Sub, Eadi, Sunil Babu, Song, Hyun-Dong, Choi, Hyun-Woong, Lee, Ga-Won, Lee, Hi-Deok
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding
Novel test structures for extracting interface state density of advanced CMOSFETs using optical charge pumping
Song, Hyeong-Sub, Oh, Dong-Jun, Kim, So-Yeong, Kwon, Sung-Kyu, Choi, Sungju, Kim, Dae Hwan, Lim, Dong-Hwan, Choi, Chang-Hwan, Kim, Dong Myong, Lee, Hi-Deok
Published in 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2018)
Published in 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2018)
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Conference Proceeding