Dependence of the 1/f Noise Characteristics of CMOSFETs on Body Bias in Sub-threshold and Strong Inversion Regions
Kwon, Sung-Kyu, Kwon, Hyuk-Min, Kwak, Ho-Young, Jang, Jae-Hyung, Shin, Jong-Kwan, Hwang, Seon-Man, Sung, Seung-Yong, Lee, Ga-Won, Lee, Song-Jae, Han, In-Shik, Chung, Yi-Sun, Lee, Jung-Hwan, Lee, Hi-Deok
Published in Journal of semiconductor technology and science (01.12.2013)
Published in Journal of semiconductor technology and science (01.12.2013)
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Journal Article
A novel BJT structure for high- performance analog circuit applications
Seon-Man Hwang, Hyuk-Min Kwon, Jae-Hyung Jang, Ho-Young Kwak, Sung-Kyu Kwon, Seung-Yong Sung, Jong-Kwan Shin, Jae-Nam Yu, In-Shik Han, Yi-Sun Chung, Jung-Hwan Lee, Ga-Won Lee, Hi-Deok Lee
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
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Conference Proceeding
Dependence of the 1/f Noise Characteristics of CMOSFETs on Body Bias in Sub-threshold and Strong Inversion Regions
Kwon, Sung-Kyu, Kwon, Hyuk-Min, Kwak, Ho-Young, Jang, Jae-Hyung, Shin, Jong-Kwan, Hwang, Seon-Man, Sung, Seung-Yong, Lee, Ga-Won, Lee, Song-Jae, Han, In-Shik, Chung, Yi-Sun, Lee, Jung-Hwan, Lee, Hi-Deok
Published in Journal of semiconductor technology and science (2013)
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Published in Journal of semiconductor technology and science (2013)
Journal Article
Sampler of composite probe for sampling test sample with high purity
LEE MAN EOP,HWANG SEON CHUN,KIM HYO SANG,KWON YONG CHEOL,LEE CHONG MIN
Year of Publication 15.03.2006
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Year of Publication 15.03.2006
Patent