Reliability characterizations of display driver IC on High-k/ metal-gate technology
Donghoon Kim, Jungdong Kim, Kidan Bae, Hyejin Kim, Lira Hwang, Sangchul Shin, Hyung-Nyung Park, In-Taek Ku, Jongwoo Park, Sangwoo Pae, Haebum Lee
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Get full text
Conference Proceeding
Frequency dependent TDDB behaviors and its reliability qualification in 32nm high-k/metal gate CMOSFETs
Kyong Taek Lee, Jongik Nam, Minjung Jin, Kidan Bae, Junekyun Park, Lira Hwang, Jungin Kim, Hyunjin Kim, Jongwoo Park
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Get full text
Conference Proceeding
Behaviors and physical degradation of HfSiON MOSFET linked to strained CESL performance booster
Kidan Bae, Minjung Jin, Hajin Lim, Lira Hwang, Dongseok Shin, Junekyun Park, Jinchul Heo, Jongho Lee, Jinho Do, Ilchan Bae, Chulhee Jeon, Jongwoo Park
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Get full text
Conference Proceeding
Experimental study on BTI variation impacts in SRAM based on high-k/metal gate FinFET: From transistor level Vth mismatch, cell level SNM to product level Vmin
Liu, Changze, Nam, Hyeonwoo, Kim, Kangjung, Choo, Seungjin, Kim, Hyejin, Kim, Hyunjin, Kim, Yoohwan, Lee, Soonyoung, Yoon, Sungyoung, Kim, Jungin, Kim, Jin Ju, Hwang, Lira, Ha, Sungmock, Jin, Min-Jung, Sagong, Hyun Chul, Park, June-Kyun, Pae, Sangwoo, Park, Jongwoo
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)
Get full text
Conference Proceeding
Journal Article