by Ryckaert, J., Schuddinck, P., Weckx, P., Bouche, G., Vincent, B., Smith, J., Sherazi, Y., Mallik, A., Mertens, H., Demuynck, S., Bao, T. Huynh, Veloso, A., Horiguchi, N., Mocuta, A., Mocuta, D., Boemmels, J.
Published in 2018 IEEE Symposium on VLSI Technology (01.06.2018)

by Thean, A. V.-Y, Yakimets, D., Huynh Bao, T., Schuddinck, P., Sakhare, S., Bardon, M. Garcia, Sibaja-Hernandez, A., Ciofi, I., Eneman, G., Veloso, A., Ryckaert, J., Raghavan, P., Mercha, A., Mocuta, A., Tokei, Z., Verkest, D., Wambacq, P., De Meyer, K., Collaert, N.
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)

by Veloso, A., Huynh-Bao, T., Matagne, P., Jang, D., Eneman, G., Horiguchi, N., Ryckaert, J.
Published in Solid-state electronics (01.06.2020)

by Veloso, A., Hikavyy, A., Loo, R., Paraschiv, V., Chan, B. T., Radisic, D., Li, W., Versluijs, J. J., Teugels, L., Sebaai, F., Favia, P., Eneman, G., Bender, H., Vancoille, E., Scheerder, J. E., Fleischmann, C., Horiguchi, N., Matagne, P., Huynh-Bao, T., Chasin, A., Simoen, E., Vecchio, E., Devriendt, K., Brus, S., Rosseel, E.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)

by Veloso, A., Matagne, P., Eneman, G., Jang, D., Huynh-Bao, T., Chasin, A., Simoen, E., De Keersgieter, A., Horiguchi, N.
Published in 2020 China Semiconductor Technology International Conference (CSTIC) (26.06.2020)

by Veloso, A., Huynh-Bao, T., Matagne, P., Jang, D., Horiguchi, N., Ryckaert, J., Mocuta, D.
Published in 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) (01.04.2019)

by Veloso, Anabela, Altamirano-Sánchez, Efraín, Brus, Stephan, Chan, B. T., Cupak, Miroslav, Dehan, Morin, Delvaux, Christie, Devriendt, Katia, Eneman, Geert, Ercken, Monique, Huynh-Bao, Trong, Ivanov, Tsvetan, Matagne, Philippe, Merckling, Clement, Paraschiv, Vasile, Ramesh, Siva, Rosseel, Erik, Rynders, Luc, Sibaja-Hernandez, Arturo, Suhard, Samuel, Tao, Zheng, Vecchio, Emma, Waldron, Niamh, Yakimets, Dmitry, De Meyer, Kristin, Mocuta, Dan, Collaert, Nadine, Thean, Aaron
Published in ECS transactions (04.05.2016)

by Veloso, A., Parvais, B., Matagne, P., Simoen, E., Huynh-Bao, T., Paraschiv, V., Vecchio, E., Devriendt, K., Rosseel, E., Ercken, M., Chan, B. T., Delvaux, C., Altamirano-Sanchez, E., Versluijs, J. J., Tao, Z., Suhard, S., Brus, S., Sibaja-Hernandez, A., Waldron, N., Lagrain, P., Richard, O., Bender, H., Chasin, A., Kaczer, B., Ivanov, T., Ramesh, S., De Meyer, K., Ryckaert, J., Collaert, N., Thean, A.
Published in 2016 IEEE Symposium on VLSI Technology (01.06.2016)

by Kim, M.-S., Harada, N., Kikuchi, Y., Boemmels, J., Mitard, J., Huynh-Bao, T., Matagne, P., Tao, Z., Li, W., Devriendt, K., Ragnarsson, L.-A., Lorant, C., Sebaai, F., Porret, C., Rosseel, E., Dangol, A., Batuk, D., Martinez-Alanis, G., Geypen, J., Jourdan, N., Sepulveda, A., Puliyalil, H., Jamieson, G., van der Veen, M., Teugels, L., El-Mekki, Z., Altamirano-Sanchez, E., Li, Y., Nakamura, H., Mocuta, D., Masuoka, F.
Published in 2019 Symposium on VLSI Technology (01.06.2019)

by Bao, T. Huynh, Yakimets, D., Ryckaert, J., Ciofi, I., Baert, R., Veloso, A., Boemmels, J., Collaert, N., Roussel, P., Demuynck, S., Raghavan, P., Mercha, A., Tokei, Z., Verkest, D., Thean, A. V-Y, Wambacq, P.
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)

by Veloso, Anabela, Paraschiv, Vasile, Vecchio, Emma, Devriendt, Katia, Li, Waikin, Simoen, Eddy, Chan, B. T., Tao, Zheng, Rosseel, Erik, Loo, Roger, Milenin, Alexey P., Kunert, Bernardette, Teugels, Lieve, Sebaai, Farid, Lorant, Christophe, van Dorp, Dennis, Altamirano-Sánchez, Efraín, Brus, Stephan, Marien, Philippe, Fleischmann, Claudia, Melkonyan, Davit, Huynh-Bao, Trong, Eneman, Geert, Hellings, Geert, Sibaja-Hernandez, Arturo, Matagne, Philippe, Waldron, Niamh, Mocuta, Dan, Collaert, Nadine
Published in ECS transactions (15.08.2017)

by Yakimets, D., Bao, T. Huynh, Bardon, M. Garcia, Dehan, M., Collaert, N., Mercha, A., Tokei, Z., Thean, A., Verkest, D., De Meyer, K.
Published in 72nd Device Research Conference (01.06.2014)

by Matagne, P., Nakamura, H., Kim, M.-S., Kikuchi, Y., Huynh-Bao, T., Tao, Z., Li, W., Devriendt, K., Ragnarsson, L.-A., Boemmels, J., Mallik, A., Altamirano-Sachez, E., Sebaai, F., Lorant, C., Jourdan, N., Porret, C., Mocuta, D., Harada, N., Masuoka, F.
Published in 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2018)

by Thean, Aaron, Collaert, Nadine, Radu, Iuliana P., Waldron, Niamh, Merckling, Clement, Witters, Liesbeth, Loo, Roger, Mitard, Jerome, Rooyackers, Rita, Vandooren, Anne, Verhulst, A., Veloso, Anabela, Yakimets, D., Bao, T. Huynh, Chiappe, Danielle, Vaysset, A., Zografos, O., Caymax, Matty, Huyghebaert, C, Barla, Kathy, Steegen, A.
Published in ECS transactions (31.03.2015)

by Sakhare, S., Perumkunnil, M., Bao, T. Huynh, Rao, S., Kim, W., Crotti, D., Yasin, F., Couet, S., Swerts, J., Kundu, S., Yakimets, D., Baert, R., Oh, HR, Spessot, A., Mocuta, A., Kar, G. Sankar, Furnemont, A.
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)

by Huynh-Bao, T., Sakhare, S., Ryckaert, J., Spessot, A., Verkest, D., Mocuta, A.
Published in 2017 IEEE International Conference on IC Design and Technology (ICICDT) (01.05.2017)

by Collaert, N., Veloso, A., Huynh-Bao, T., Yakimets, D., Ivanov, Ts, Ramesh, S., Matagne, P., Sibaja-Hernandez, A., Liu, Z., Merckling, C., Waldron, N., Thean, A.
Published in 2016 IEEE Nanotechnology Materials and Devices Conference (NMDC) (01.10.2016)

by Veloso, A., Tao, Z., Li, W., Altamirano-Sanchez, E., Versluijs, J. J., Brus, S., Matagne, P., Waldron, N., Ryckaert, J., Mocuta, D., Collaert, N., Huynh-Bao, T., Rosseel, E., Paraschiv, V., Devriendt, K., Vecchio, E., Delvaux, C., Chan, B. T., Ercken, M.
Published in 2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (01.10.2016)

by Thean, Aaron, Collaert, Nadine, Radu, Iuliana P., Waldron, Niamh, Merckling, Clement, Witters, Liesbeth, Loo, Roger, Mitard, Jerome, Rooyackers, Rita, Vandooren, Anne, Verhulst, A., Veloso, Anabela, Yakimets, D., Bao, T. Huynh, Chiappe, Danielle, Vaysset, A., Zografos, O., Caymax, Matty, Huyghebaert, C, Barla, Kathy, Steegen, A.
Published in Meeting abstracts (Electrochemical Society) (29.04.2015)

by APPELTANS, RAF, HUYNH BAO, TRONG, VELOSO, ANABELA
Year of Publication 01.11.2020