Optical determination of layered-materials InSe thickness via RGB contrast method and regression analysis
Lu, Yi-Ying, Yu, Hsiao-Ching, Wang, You-Xin, Hung, Chih-Keng, Chen, You-Ren, Jhou, Jie, Yen, Peter Tsung-Wen, Hsu, Jui-Hung, Sankar, Raman
Published in Nanotechnology (26.11.2022)
Published in Nanotechnology (26.11.2022)
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