Identification of deep trap energies and influences of oxygen plasma ashing on semiconductor carrier lifetime
Koprowski, A, Humbel, O, Plappert, M, Krenn, H
Published in Semiconductor science and technology (01.03.2015)
Published in Semiconductor science and technology (01.03.2015)
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Journal Article
Comparison of WTi and WTi(N) as diffusion barriers for Al and Cu metallization on Si with respect to thermal stability and diffusion behavior of Ti
Fugger, M., Plappert, M., Schäffer, C., Humbel, O., Hutter, H., Danninger, H., Nowottnick, M.
Published in Microelectronics and reliability (01.11.2014)
Published in Microelectronics and reliability (01.11.2014)
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Journal Article
Characterization of Ti diffusion in PVD deposited WTi/AlCu metallization on monocrystalline Si by means of secondary ion mass spectroscopy
Plappert, M., Humbel, O., Koprowski, A., Nowottnick, M.
Published in Microelectronics and reliability (01.09.2012)
Published in Microelectronics and reliability (01.09.2012)
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Journal Article
Conference Proceeding
Crossing point current of electron and proton irradiated power P-i-N diodes
Vobecký, J., Hazdra, P., Humbel, O., Galster, N.
Published in Microelectronics and reliability (01.03.2000)
Published in Microelectronics and reliability (01.03.2000)
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Journal Article
A new degree of freedom in diode optimization: arbitrary axial lifetime profiles by means of ion irradiation
Hazdra, P., Vobecky, J., Galster, N., Humbel, O., Dalibor, T.
Published in 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094) (2000)
Published in 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094) (2000)
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Conference Proceeding
Increase of the Robustness of the junction terminations of power devices by a lateral variation of the Emitter Efficiency
Schulze, H-J, Bauer, J-G, Falck, E., Niedernostheide, F-J, Biermann, J., Dutemeyer, T., Humbel, O., Schieber, A.
Published in 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2013)
Published in 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2013)
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Conference Proceeding
Experimental Study of a 6.5kV MOS Controllable Freewheeling Diode
Bauer, J.G., Duetemeyer, T., Hille, F., Humbel, O.
Published in 2008 20th International Symposium on Power Semiconductor Devices and IC's (01.05.2008)
Published in 2008 20th International Symposium on Power Semiconductor Devices and IC's (01.05.2008)
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Conference Proceeding
4.5 kV-fast-diodes with expanded SOA using a multi-energy proton lifetime control technique
Humbel, O., Galster, N., Bauer, F., Fichtner, W.
Published in 11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312) (1999)
Published in 11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312) (1999)
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Conference Proceeding