CDM Simulation Based on Tester, Package and Full Integrated Circuit Modeling: Case Study
Abessolo-Bidzo, D., Smedes, T., Huitsing, A. J.
Published in IEEE transactions on electron devices (01.11.2012)
Published in IEEE transactions on electron devices (01.11.2012)
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Journal Article
The application of transmission line pulse testing for the ESD analysis of integrated circuits
Smedes, T, Velghe, R.M.D.A, Ruth, R.S, Huitsing, A.J
Published in Journal of electrostatics (01.10.2002)
Published in Journal of electrostatics (01.10.2002)
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Journal Article
Predictive CDM simulation approach based on tester, package and full integrated circuit modeling
Abessolo-Bidzo, D., Smedes, T., Huitsing, A. J.
Published in EOS/ESD Symposium Proceedings (01.09.2011)
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Published in EOS/ESD Symposium Proceedings (01.09.2011)
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