by Huisman, L.M.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2004)

by Huisman, L.M., Kassab, M., Pastel, L.
Published in 2004 International Conferce on Test (2004)

by Huisman, L.M.
Published in Proceedings ETC 93 Third European Test Conference (1993)

by Huisman, L.M.
Published in Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) (1998)

by Huisman, L.M., Kundu, S.
Published in IEEE transactions on parallel and distributed systems (01.01.1994)

by Kundu, S., Huisman, L.M., Nair, I., Ivenaar, V., Reddy, L.N.
Published in Proceedings International Test Conference 1992 (1992)

by Huisman, L.M., Daoud, R.
Published in Proceedings. International Test Conference 1990 (1990)

by Maxwell, P.C., Aitken, R.C., Huisman, L.M.
Published in Proceedings., International Test Conference (1994)

by Barzilai, Z., Beece, D.K., Huisman, L.M., Iyengar, V.S., Silberman, G.M.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.08.1988)

by Carter, L., Huisman, L.M., Williams, T.W.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.1988)

by Huisman, L.M.
Published in IEEE design & test of computers (01.12.1988)

by Barzilai, Z., Beece, D.K., Huisman, L.M., Iyengar, V.S., Silberman, G.M.
Published in 23rd ACM/IEEE Design Automation Conference (1986)