Automatic Prediction of Metal–Oxide–Semiconductor Field‐Effect Transistor Threshold Voltage Using Machine Learning Algorithm
Choi, Seoyeon, Park, Dong Geun, Kim, Min Jung, Bang, Seain, Kim, Jungchun, Jin, Seunghee, Huh, Ki Seok, Kim, Donghyun, Mitard, Jerome, Han, Cheol E., Lee, Jae Woo
Published in Advanced intelligent systems (01.01.2023)
Published in Advanced intelligent systems (01.01.2023)
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Journal Article
Automatic Prediction of Metal–Oxide–Semiconductor Field‐Effect Transistor Threshold Voltage Using Machine Learning Algorithm
Choi, Seoyeon, Park, Dong Geun, Kim, Min Jung, Bang, Seain, Kim, Jungchun, Jin, Seunghee, Huh, Ki Seok, Kim, Donghyun, Mitard, Jerome, Han, Cheol E., Lee, Jae Woo
Published in Advanced intelligent systems (01.01.2023)
Published in Advanced intelligent systems (01.01.2023)
Get full text
Journal Article
Automatic prediction of MOSFETs threshold voltage by machine learning algorithms
Choi, Seoyeon, Park, Dong Geun, Kim, Min Jung, Bang, Seain, Kim, Jungchun, Jin, Seunghee, Huh, Ki Seok, Kim, Donghyun, Kim, Sanghyeok, Yoon, Inkyu, Mitard, Jerome, Han, Cheol E., Lee, Jae Woo
Published in 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (07.03.2023)
Published in 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (07.03.2023)
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