Properties of high-voltage stress generated traps in thin silicon oxide
Scott, R.S., Dumin, N.A., Hughes, T.W., Dumin, D.J., Moore, B.T.
Published in IEEE transactions on electron devices (01.07.1996)
Published in IEEE transactions on electron devices (01.07.1996)
Get full text
Journal Article
Thickness dependence of low-level leakages in thin oxides
Gladstone, S.M., Scott, R.S., Runnion, E.F., Hughes, T.W., Dumin, D.J., Mitros, J.C., Lie, L.
Published in Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits (1995)
Published in Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits (1995)
Get full text
Conference Proceeding