Modelling and simulation of forming processes of metallic suspensions under non-isothermal conditions
Hufschmidt, M., Modigell, M., Petera, J.
Published in Journal of non-Newtonian fluid mechanics (10.03.2006)
Published in Journal of non-Newtonian fluid mechanics (10.03.2006)
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Journal Article
Conference Proceeding
Evaluation and Modeling of Chemical Segregation Effects for Thixoforming Processing
Noll, T., Friedrich, B., Hufschmidt, M., Modigell, M., Nohn, B., Hartmann, D.
Published in Advanced engineering materials (01.03.2003)
Published in Advanced engineering materials (01.03.2003)
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Journal Article
The influence of edge effects on the determination of the doping profile of silicon pad diodes
Fretwurst, E., Garutti, E., Hufschmidt, M., Klanner, R., Kopsalis, I., Schwandt, J.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21.09.2017)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21.09.2017)
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Journal Article
Prototyping in industrial software projects-bridging the gap between theory and practice
Lichter, H., Schneider-Hufschmidt, M., Zullighoven, H.
Published in IEEE transactions on software engineering (01.11.1994)
Published in IEEE transactions on software engineering (01.11.1994)
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Journal Article
Oesophagusperforation/-ruptur: Stentung als primäre Therapieoption
Hufschmidt, M, Tschann, P, Flatz, T, Wenzl, E
Published in Zeitschrift für Gastroenterologie (12.05.2015)
Published in Zeitschrift für Gastroenterologie (12.05.2015)
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Conference Proceeding
The influence of edge effects on the determination of the doping profile of silicon pad diodes
Hufschmidt, M., Fretwurst, E., Garutti, E., Klanner, R., Kopsalis, I., Schwandt, J., Tohermes, B.
Published in 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) (01.10.2016)
Published in 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) (01.10.2016)
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Conference Proceeding