Modeling of IGBT Resistive and Inductive Turn-On Behavior
Bryant, A.T., Liqing Lu, Santi, E., Hudgins, J.L., Palmer, P.R.
Published in IEEE transactions on industry applications (01.05.2008)
Published in IEEE transactions on industry applications (01.05.2008)
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Journal Article
Characterization and modeling of high-voltage field-stop IGBTs
Xiaosong Kang, Caiafa, A., Santi, E., Hudgins, J.L., Palmer, P.R.
Published in IEEE transactions on industry applications (01.07.2003)
Published in IEEE transactions on industry applications (01.07.2003)
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Journal Article
Exploration of Power Device Reliability using Compact Device Models and Fast Electro-Thermal Simulation
Bryant, A.T., Mawby, P.A., Palmer, P.R., Santi, E., Hudgins, J.L.
Published in Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting (01.10.2006)
Published in Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting (01.10.2006)
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Conference Proceeding
Destruction-Free Parameter Extraction for a Physics-Based Circuit Simulator IGCT Model
Xiaobin Wang, Hudgins, J.L., Santi, E., Palmer, P.R.
Published in IEEE transactions on industry applications (01.11.2006)
Published in IEEE transactions on industry applications (01.11.2006)
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Journal Article
Temperature effects on trench-gate punch-through IGBTs
Santi, E., Xiaosong Kang, Caiafa, A., Hudgins, J.L., Palmer, P.R., Goodwine, D.Q., Monti, A.
Published in IEEE transactions on industry applications (01.03.2004)
Published in IEEE transactions on industry applications (01.03.2004)
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Journal Article
Review of technologies for current-limiting low-voltage circuit breakers
Brice, C.W., Dougal, R.A., Hudgins, J.L.
Published in IEEE transactions on industry applications (01.09.1996)
Published in IEEE transactions on industry applications (01.09.1996)
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Journal Article
Transient Electrothermal Simulation of Power Semiconductor Devices
Bin Du, Hudgins, J.L., Santi, E., Bryant, A.T., Palmer, P.R., Mantooth, H.A.
Published in IEEE transactions on power electronics (01.01.2010)
Published in IEEE transactions on power electronics (01.01.2010)
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Journal Article
An assessment of wide bandgap semiconductors for power devices
Hudgins, J.L., Simin, G.S., Santi, E., Khan, M.A.
Published in IEEE transactions on power electronics (01.05.2003)
Published in IEEE transactions on power electronics (01.05.2003)
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Journal Article
Circuit simulator models for the diode and IGBT with full temperature dependent features
Palmer, P.R., Santi, E., Hudgins, J.L., Xiaosong Kang, Joyce, J.C., Poh Yoon Eng
Published in IEEE transactions on power electronics (01.09.2003)
Published in IEEE transactions on power electronics (01.09.2003)
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Journal Article
Physical Modeling of Fast p-i-n Diodes With Carrier Lifetime Zoning, Part I: Device Model
Bryant, A.T., Liqing Lu, Santi, E., Palmer, P.R., Hudgins, J.L.
Published in IEEE transactions on power electronics (01.01.2008)
Published in IEEE transactions on power electronics (01.01.2008)
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Journal Article
Role of the amplifying gate in the turn-on process of involute structure thyristors
Sankaran, V.A., Hudgins, J.L., Portnoy, W.M.
Published in IEEE transactions on power electronics (01.04.1990)
Published in IEEE transactions on power electronics (01.04.1990)
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Journal Article
Modeling of MOS-Side Carrier Injection in Trench-Gate IGBTs
Liqing Lu, Zhiyang Chen, Bryant, A., Hudgins, J.L., Palmer, P.R., Santi, E.
Published in IEEE transactions on industry applications (01.03.2010)
Published in IEEE transactions on industry applications (01.03.2010)
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Journal Article
Physical Modeling of Fast p-i-n Diodes With Carrier Lifetime Zoning, Part II: Parameter Extraction
Liqing Lu, Bryant, A.T., Santi, E., Palmer, P.R., Hudgins, J.L.
Published in IEEE transactions on power electronics (01.01.2008)
Published in IEEE transactions on power electronics (01.01.2008)
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Journal Article
Extraction of parasitic circuit elements in a PEBB for application in the virtual test bed
Beker, B., Hudgins, J.L., Coronati, J., Gillett, B., Shekhawat, S.
Published in IAS '97. Conference Record of the 1997 IEEE Industry Applications Conference Thirty-Second IAS Annual Meeting (1997)
Published in IAS '97. Conference Record of the 1997 IEEE Industry Applications Conference Thirty-Second IAS Annual Meeting (1997)
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Conference Proceeding
Expanded Thermal Model for IGBT Modules
Lu, B., Hudgins, J.L., Bryant, A.T., Santi, E., Palmer, P.R.
Published in Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting (01.10.2006)
Published in Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting (01.10.2006)
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Conference Proceeding
Physical Modeling and Parameter Extraction Procedure for p-i-n Diodes with Lifetime Control
Lu, L., Bryant, A., Santi, E., Hudgins, J.L., Palmer, P.R.
Published in Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting (01.10.2006)
Published in Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting (01.10.2006)
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Conference Proceeding
Physics-Based Model of IGBT Including MOS Side Two-Dimensional Effects
Lu, L., Bryant, A., Santi, E., Hudgins, J.L., Palmer, P.R.
Published in Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting (01.10.2006)
Published in Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting (01.10.2006)
Get full text
Conference Proceeding