High-resolution imaging of defects in CdTe solar cells using thermoreflectance
Katz, N, Patterson, M, Zaunbrecher, K, Johnston, S, Hudgings, J
Published in Electronics letters (21.11.2013)
Published in Electronics letters (21.11.2013)
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Journal Article
High contrast, depth-resolved thermoreflectance imaging using a Nipkow disk confocal microscope
Summers, J A, Yang, T, Tuominen, M T, Hudgings, J A
Published in Review of scientific instruments (01.01.2010)
Published in Review of scientific instruments (01.01.2010)
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Journal Article
Thermal profiling: locating the onset of gain saturation in semiconductor optical amplifiers
Luerssen, D., Ram, R.J., Hohl-AbiChedid, A., Clausen, E., Hudgings, J.A.
Published in IEEE photonics technology letters (01.07.2004)
Published in IEEE photonics technology letters (01.07.2004)
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Journal Article
Temperature Profiling of VCSELs by Thermoreflectance Microscopy
Farzaneh, M., Amatya, R., Luerszen, D., Greenberg, K.J., Rockwell, W.E., Hudgings, J.A.
Published in IEEE photonics technology letters (15.04.2007)
Published in IEEE photonics technology letters (15.04.2007)
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Journal Article
Quantifying Optical Feedback Into Semiconductor Lasers via Thermal Profiling
Kapusta, E.W., Lueren, D., Hudgings, J.A.
Published in IEEE photonics technology letters (15.01.2006)
Published in IEEE photonics technology letters (15.01.2006)
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Journal Article
Modulation of a vertical-cavity surface-emitting laser using an intracavity quantum-well absorber
Lim, S.F., Hudgings, J.A., Chen, L.P., Li, G.S., Wupen Yuen, Lau, K.Y., Chang-Hasnain, C.J.
Published in IEEE photonics technology letters (01.03.1998)
Published in IEEE photonics technology letters (01.03.1998)
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Journal Article
Independent phase and magnitude control of an optically carried microwave signal with a three-terminal vertical-cavity surface-emitting laser
Stone, R.J., Hudgings, J.A., Lim, S.F., Chang-Hasnain, C.J., Lau, K.Y.
Published in IEEE photonics technology letters (01.04.1999)
Published in IEEE photonics technology letters (01.04.1999)
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Journal Article
Radial temperature profiling of VCSELs
LuerBen, D., Ram, R.J., Hudgings, J.
Published in (CLEO). Conference on Lasers and Electro-Optics, 2005 (2005)
Published in (CLEO). Conference on Lasers and Electro-Optics, 2005 (2005)
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Conference Proceeding
Sensitivity to optical feedback of oxide-confined vs. proton-implanted VCSELs
Judge, P.A., Quay, C.H.L., Hudgings, J.A.
Published in IEEE/LEOS Summer Topi All-Optical Networking: Existing and Emerging Architecture and Applications/Dynamic Enablers of Next-Generation Optical Communications Systems/Fast Optical Processing in Optical (2002)
Published in IEEE/LEOS Summer Topi All-Optical Networking: Existing and Emerging Architecture and Applications/Dynamic Enablers of Next-Generation Optical Communications Systems/Fast Optical Processing in Optical (2002)
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Conference Proceeding
Using thermal profiling to quantify optical feedback into semiconductor lasers
Kapusta, E., Luerssen, D., Hudgings, J.
Published in 2005 Quantum Electronics and Laser Science Conference (2005)
Published in 2005 Quantum Electronics and Laser Science Conference (2005)
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Conference Proceeding
Thermal profiling of gain saturation in semiconductor optical amplifiers
Luerssen, D., Hudgings, J., Ram, R.J., Clausen, E., Hohl-AbiChedid, A.
Published in Conference on Lasers and Electro-Optics, 2004. (CLEO) (2004)
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Published in Conference on Lasers and Electro-Optics, 2004. (CLEO) (2004)
Conference Proceeding