Electrical and optical localisation of leakage current and breakdown point in SiOC:H low-k dielectrics
Vidal-Dho, Matthias, Hubert, Quentin, Gonon, Patrice, Pelissier, Bernard, Lentrein, Philippe, Ray, Patrice, Moragues, Jean-Michel, Fornara, Pascal
Published in 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) (01.05.2020)
Published in 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) (01.05.2020)
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Conference Proceeding
Assessment of Self-Induced Joule-Heating Effect in the I―V Readout Region of Polycrystalline Ge2Sb2Te5 Phase-Change Memory
BETTI BENEVENTI, Giovanni, PERNIOLA, Luca, HUBERT, Quentin, GLIERE, Alain, LARCHER, Luca, PAVAN, Paolo, DE SALVO, Barbara
Published in IEEE transactions on electron devices (2012)
Published in IEEE transactions on electron devices (2012)
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Journal Article
Detailed Analysis of the Role of Thin- Interfacial Layer in -Based PCM
Hubert, Q., Jahan, C., Toffoli, A., Delaye, V., Lafond, D., Grampeix, H., de Salvo, B.
Published in IEEE transactions on electron devices (01.07.2013)
Published in IEEE transactions on electron devices (01.07.2013)
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Journal Article
Moisture Influence on Reliability and Electrical Characteristics of SiOC:H Low-k Dielectric Material
Vidal-Dho, Matthias, Hubert, Quentin, Gonon, Patrice, Pelissier, Bernard, Fornara, Pascal, Escales, Jean-Philippe, Potard, Pascale, Moragues, Jean-Michel, Ogier, Jean-Luc
Published in 2019 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2019)
Published in 2019 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2019)
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Conference Proceeding
Probing impact on pad moisture tightness: A challenge for pad size reduction
Vidal-Dho, Matthias, Hubert, Quentin, Gonon, Patrice, Delorme, Philippe, Jacquot, Jonathan, Marchetti, Maxime, Beauvisage, Ludovic, Moragues, Jean-Michel, Potard, Pascale, Fornara, Pascal, Escales, Jean-Philippe, Sallagoity, Pascal, Pizzuto, Olivier, Maury, Delphine, Mirabel, Jean-Michel
Published in 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) (01.03.2019)
Published in 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) (01.03.2019)
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Conference Proceeding
Assessment of Self-Induced Joule-Heating Effect in the I- V Readout Region of Polycrystalline \hbox\hbox\hbox Phase-Change Memory
Beneventi, G. B., Perniola, L., Hubert, Q., Gliere, A., Larcher, L., Pavan, P., De Salvo, B.
Published in IEEE transactions on electron devices (01.01.2012)
Published in IEEE transactions on electron devices (01.01.2012)
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Journal Article
Integrated circuit with vertically structured capacitive element, and its fabricating process
Cabout, Thomas, Hubert, Quentin, Regnier, Arnaud, Marzaki, Abderrezak, Niel, Stephan
Year of Publication 05.10.2021
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Year of Publication 05.10.2021
Patent
Integrated circuit with vertically structured capacitive element, and its fabricating process
Cabout, Thomas, Hubert, Quentin, Regnier, Arnaud, Marzaki, Abderrezak, Niel, Stephan
Year of Publication 03.08.2021
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Year of Publication 03.08.2021
Patent