Dependence of DC Parameters on Layout and Low-Frequency Noise Behavior in Strained-Si nMOSFETs Fabricated by Stress-Memorization Technique
Yao-Tsung Huang, San Lein Wu, Shoou Jinn Chang, Cheng Wen Kuo, Ya Ting Chen, Yao-Chin Cheng, Cheng, Osbert
Published in IEEE electron device letters (01.05.2010)
Published in IEEE electron device letters (01.05.2010)
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Origin of Stress Memorization Mechanism in Strained-Si nMOSFETs Using a Low-Cost Stress-Memorization Technique
Yao-Tsung Huang, San-Lein Wu, Shoou-Jinn Chang, Cheng-Wen Kuo, Ya-Ting Chen, Yao-Chin Cheng, Cheng, Osbert
Published in IEEE transactions on nanotechnology (01.09.2011)
Published in IEEE transactions on nanotechnology (01.09.2011)
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Enhancement of CMOSFETs Performance by Utilizing SACVD-Based Shallow Trench Isolation for the 40-nm Node and Beyond
Yao-Tsung Huang, San-Lein Wu, Shoou-Jinn Chang, Chin-Kai Hung, Tzu-Juei Wang, Cheng-Wen Kuo, Cheng-Tung Huang, Cheng, Osbert
Published in IEEE transactions on nanotechnology (01.05.2011)
Published in IEEE transactions on nanotechnology (01.05.2011)
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Investigation of Stress Memorization Process on Low-Frequency Noise Performance for Strained Si n-Type Metal--Oxide--Semiconductor Field-Effect Transistors
Kuo, Cheng-Wen, Wu, San-Lein, Lin, Hau-Yu, Huang, Yao-Tsung, Chang, Shoou-Jinn, Hong, De-Gong, Wu, Chung-Yi, Cheng, Yao-Chin, Cheng, Osbert
Published in Japanese Journal of Applied Physics (01.04.2011)
Published in Japanese Journal of Applied Physics (01.04.2011)
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CMOS Dual-Work-Function Engineering by Using Implanted Ni-FUSI
Chien-Ting Lin, Ramin, M., Pas, M., Wise, R., Yean-Kuen Fang, Che-Hua Hsu, Yao-Tsung Huang, Li-Wei Cheng, Ma, M.
Published in IEEE electron device letters (01.09.2007)
Published in IEEE electron device letters (01.09.2007)
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PMOSFET Reliability Study for Direct Silicon Bond (DSB) Hybrid Orientation Technology (HOT)
Yao-Tsung Huang, Pinto, A., Chien-Ting Lin, Che-Hua Hsu, Ramin, M., Seacrist, M., Ries, M., Matthews, K., Nguyen, B., Freeman, M., Wilks, B., Stager, C., Johnson, C., Denning, L., Bennett, J., Joshi, S., Chiang, S., Li-Wei Cheng, Tung-Hsing Lee, Ma, M., Osbert Cheng, Wise, R.
Published in IEEE electron device letters (01.09.2007)
Published in IEEE electron device letters (01.09.2007)
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Characteristics of Si/SiO2 Interface Properties for CMOS Fabricated on Hybrid Orientation Substrate Using Amorphization/Templated Recrystallization (ATR) Method
PO CHIN HUANG, SAN LEIN WU, SHOOU JINN CHANG, YAO TSUNG HUANG, CHEN, Jone F, CHIEN TING LIN, MIKE MA, CHENG, Osbert
Published in IEEE transactions on electron devices (01.06.2011)
Published in IEEE transactions on electron devices (01.06.2011)
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Journal Article
Temperature Dependence of Electrical Characteristics of Strained nMOSFETs Using Stress Memorization Technique
Po Chin Huang, San Lein Wu, Shoou Jinn Chang, Cheng Wen Kuo, Ching Yao Chang, Yao Tsung Huang, Yao Chin Cheng, Cheng, Osbert
Published in IEEE electron device letters (01.07.2011)
Published in IEEE electron device letters (01.07.2011)
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Journal Article
Impact of Reducing Shallow Trench Isolation Mechanical Stress on Active Length for 40 nm n-Type Metal--Oxide--Semiconductor Field-Effect Transistors
Huang, Yao-Tsung, Wu, San-Lein, Lin, Hau-Yu, Kuo, Cheng-Wen, Chang, Shoou-Jinn, Hong, De-Gong, Wu, Chung-Yi, Huang, Cheng-Tung, Cheng, Osbert
Published in Japanese Journal of Applied Physics (01.04.2011)
Published in Japanese Journal of Applied Physics (01.04.2011)
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Journal Article
Investigation of Stress Memorization Process on Low-Frequency Noise Performance for Strained Si n-Type Metal–Oxide–Semiconductor Field-Effect Transistors
Kuo, Cheng-Wen, Wu, San-Lein, Lin, Hau-Yu, Huang, Yao-Tsung, Chang, Shoou-Jinn, Hong, De-Gong, Wu, Chung-Yi, Cheng, Yao-Chin, Cheng, Osbert
Published in Japanese Journal of Applied Physics (01.04.2011)
Published in Japanese Journal of Applied Physics (01.04.2011)
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Journal Article
Impact of Reducing Shallow Trench Isolation Mechanical Stress on Active Length for 40 nm n-Type Metal–Oxide–Semiconductor Field-Effect Transistors
Huang, Yao-Tsung, Wu, San-Lein, Lin, Hau-Yu, Kuo, Cheng-Wen, Chang, Shoou-Jinn, Hong, De-Gong, Wu, Chung-Yi, Huang, Cheng-Tung, Cheng, Osbert
Published in Japanese Journal of Applied Physics (01.04.2011)
Published in Japanese Journal of Applied Physics (01.04.2011)
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Journal Article
Evaluation of Interface Property and DC Characteristics Enhancement in Nanoscale n-Channel Metal--Oxide--Semiconductor Field-Effect Transistor Using Stress Memorization Technique
Huang, Po Chin, Wu, San Lein, Chang, Shoou Jinn, Huang, Yao Tsung, Kuo, Cheng Wen, Chang, Ching Yao, Cheng, Yao Chin, Cheng, Osbert
Published in Japanese Journal of Applied Physics (01.09.2010)
Published in Japanese Journal of Applied Physics (01.09.2010)
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Journal Article
Disseminated prostatic carcinoma simulating primary lung cancer. Indications for immunodiagnostic studies
Gentile, Patrick S., Carloss, Harry W., Huang, Tsung‐Yao, Yam, Lung T., K.W., WILLIAM
Published in Cancer (15.08.1988)
Published in Cancer (15.08.1988)
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Extra Bonus on Transistor Optimization with Stress Enhanced Notched-Gate Technology for Sub-90 nm Complementary Metal Oxide Semiconductor Field Effect Transistor
Lin, Chien-Ting, Fang, Yean-Kuen, Lai, Chieh-Ming, Yeh, Wen-Kuan, Hsu, Che-Hua, Cheng, Li-Wei, Huang, Yao-Tsung, Ma, Guang Hwa
Published in Japanese Journal of Applied Physics (01.04.2007)
Published in Japanese Journal of Applied Physics (01.04.2007)
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Journal Article
Scrotal herniation of the bladder secondary to prostate enlargement
Huang, T Y, Shields, R E, Huang, J T, Postel, G C, Abaskaron, M A
Published in The Journal of urology (01.08.1999)
Published in The Journal of urology (01.08.1999)
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