Characterization of Oxygen Accumulation in Indium-Tin-Oxide for Resistance Random Access Memory
Zhang, Rui, Young, Tai-Fa, Chen, Min-Chen, Chen, Hsin-Lu, Liang, Shu-Ping, Syu, Yong-En, Sze, Simon M., Chang, Kuan-Chang, Chang, Ting-Chang, Tsai, Tsung-Ming, Huang, Syuan-Yong, Chen, Wen-Jen, Chen, Kai-Huang, Lou, Jen-Chung, Chen, Jung-Hui
Published in IEEE electron device letters (01.06.2014)
Published in IEEE electron device letters (01.06.2014)
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Journal Article
Resistive Switching Modification by Ultraviolet Illumination in Transparent Electrode Resistive Random Access Memory
Shih, Chih-Cheng, Chang, Kuan-Chang, Chang, Ting-Chang, Tsai, Tsung-Ming, Zhang, Rui, Chen, Jung-Hui, Chen, Kai-Huang, Young, Tai-Fa, Chen, Hsin-Lu, Lou, Jen-Chung, Chu, Tian-Jian, Huang, Syuan-Yong, Bao, Ding-Hua, Sze, Simon M.
Published in IEEE electron device letters (01.06.2014)
Published in IEEE electron device letters (01.06.2014)
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Journal Article
Dual Ion Effect of the Lithium Silicate Resistance Random Access Memory
Kuan-Chang Chang, Tsung-Ming Tsai, Ting-Chang Chang, Kai-Huang Chen, Rui Zhang, Zhi-Yang Wang, Jung-Hui Chen, Tai-Fa Young, Min-Chen Chen, Tian-Jian Chu, Syuan-Yong Huang, Yong-En Syu, Ding-Hua Bao, Sze, Simon M.
Published in IEEE electron device letters (01.05.2014)
Published in IEEE electron device letters (01.05.2014)
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Journal Article
Controllable Set Voltage in Bilayer ZnO:SiO2/ZnOx Resistance Random Access Memory by Oxygen Concentration Gradient Manipulation
Xuan Huang, Kuan-Chang Chang, Ting-Chang Chang, Tsung-Ming Tsai, Chih-Cheng Shih, Rui Zhang, Syuan-Yong Huang, Kai-Huang Chen, Jung-Hui Chen, Huei-Jruan Wang, Wen-Jen Chen, Fengyan Zhang, Chao Chen, Sze, Simon M.
Published in IEEE electron device letters (01.12.2014)
Published in IEEE electron device letters (01.12.2014)
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Journal Article
Tri-Resistive Switching Behavior of Hydrogen Induced Resistance Random Access Memory
Tian-Jian Chu, Tsung-Ming Tsai, Ting-Chang Chang, Kuan-Chang Chang, Rui Zhang, Kai-Huang Chen, Jung-Hui Chen, Tai-Fa Young, Jen-Wei Huang, Jen-Chung Lou, Min-Chen Chen, Syuan-Yong Huang, Hsin-Lu Chen, Yong-En Syu, Dinghua Bao, Life, Simon M.
Published in IEEE electron device letters (01.02.2014)
Published in IEEE electron device letters (01.02.2014)
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Journal Article
High performance of graphene oxide-doped silicon oxide-based resistance random access memory
Zhang, Rui, Chang, Kuan-Chang, Chang, Ting-Chang, Tsai, Tsung-Ming, Chen, Kai-Huang, Lou, Jen-Chung, Chen, Jung-Hui, Young, Tai-Fa, Shih, Chih-Cheng, Yang, Ya-Liang, Pan, Yin-Chih, Chu, Tian-Jian, Huang, Syuan-Yong, Pan, Chih-Hung, Su, Yu-Ting, Syu, Yong-En, Sze, Simon M
Published in Nanoscale research letters (21.11.2013)
Published in Nanoscale research letters (21.11.2013)
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Journal Article
Space electric field concentrated effect for Zr:SiO2 RRAM devices using porous SiO2 buffer layer
Chang, Kuan-Chang, Huang, Jen-wei, Chang, Ting-Chang, Tsai, Tsung-Ming, Chen, Kai-Huang, Young, Tai-Fa, Chen, Jung-Hui, Zhang, Rui, Lou, Jen-Chung, Huang, Syuan-Yong, Pan, Yin-Chih, Huang, Hui-Chun, Syu, Yong-En, Gan, Der-Shin, Bao, Ding-Hua, Sze, Simon M
Published in Nanoscale research letters (11.12.2013)
Published in Nanoscale research letters (11.12.2013)
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Journal Article
Improvement mechanism of resistance random access memory with supercritical CO2 fluid treatment
Chang, Kuan-Chang, Chen, Jung-Hui, Tsai, Tsung-Ming, Chang, Ting-Chang, Huang, Syuan-Yong, Zhang, Rui, Chen, Kai-Huang, Syu, Yong-En, Chang, Geng-Wei, Chu, Tian-Jian, Liu, Guan-Ru, Su, Yu-Ting, Chen, Min-Chen, Pan, Jhih-Hong, Liao, Kuo-Hsiao, Tai, Ya-Hsiang, Young, Tai-Fa, Sze, Simon, Ai, Chi-Fong, Wang, Min-Chuan, Huang, Jen-Wei
Published in The Journal of supercritical fluids (01.01.2014)
Published in The Journal of supercritical fluids (01.01.2014)
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Journal Article
Retraction notice to “Improvement Mechanism of resistance random access memory with supercritical CO2 fluid treatment” [J. Supercrit. Fluids, Volume 85, January 2014, Pages 183–189]
Chang, Kuan-Chang, Chen, Jung-Hui, Tsai, Tsung-Ming, Chang, Ting-Chang, Huang, Syuan-Yong, Zhang, Rui, Chen, Kai-Huang, Syu, Yong-En, Chang, Geng-Wei, Chu, Tian-Jian, Liu, Guan-Ru, Su, Yu-Ting, Chen, Min-Chen, Pan, Jhih-Hong, Liao, Kuo-Hsiao, Tai, Ya-Hsiang, Young, Tai-Fa, Sze, Simon M., Ai, Chi-Fong, Wang, Min-Chuan, Huang, Jen-Wei
Published in The Journal of supercritical fluids (01.12.2021)
Published in The Journal of supercritical fluids (01.12.2021)
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RETRACTED: Improvement mechanism of resistance random access memory with supercritical CO2 fluid treatment
Chang, Kuan-Chang, Chen, Jung-Hui, Tsai, Tsung-Ming, Chang, Ting-Chang, Huang, Syuan-Yong, Zhang, Rui, Chen, Kai-Huang, Syu, Yong-En, Chang, Geng-Wei, Chu, Tian-Jian, Liu, Guan-Ru, Su, Yu-Ting, Chen, Min-Chen, Pan, Jhih-Hong, Liao, Kuo-Hsiao, Tai, Ya-Hsiang, Young, Tai-Fa, Sze, Simon M., Ai, Chi-Fong, Wang, Min-Chuan, Huang, Jen-Wei
Published in The Journal of supercritical fluids (01.01.2014)
Published in The Journal of supercritical fluids (01.01.2014)
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Journal Article
Fluid based generator
WU, LI-MING, WU, HAN-YU, WU, CHUNG-PIN, HUANG, YONG-SYUAN, CHANG, YUN, WU, BO-SHIN
Year of Publication 01.09.2012
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Year of Publication 01.09.2012
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