by Hao-Yu Yang, Chi-Min Chang, Chao, M. C., Rei-Fu Huang, Shih-Chin Lin
Published in IEEE transactions on very large scale integration (VLSI) systems (01.09.2012)

by Jin-Fu Li, Yeh, J.-C., Rei-Fu Huang, Cheng-Wen Wu
Published in IEEE transactions on very large scale integration (VLSI) systems (01.06.2005)

by Chen-Wei Lin, Hung-Hsin Chen, Hao-Yu Yang, Chin-Yuan Huang, Chao, M. C-T, Rei-Fu Huang
Published in IEEE transactions on computers (01.03.2013)

by SU, Chin-Lung, HUANG, Rei-Fu, WU, Cheng-Wen, LUO, Kun-Lun, WU, Wen-Ching
Published in IEEE transactions on very large scale integration (VLSI) systems (01.12.2011)

by Hao-Yu Yang, Rei-Fu Huang, Chin-Lung Su, Kuan-Hong Lin, Hang-Kaung Shu, Chi-Wei Peng, Chao, Mango C.-T
Published in 2015 IEEE International Test Conference (ITC) (01.10.2015)

by Huang, Rei-Fu, Yang, Hao-Yu, Chao, Mango C.-T., Lin, Shih-Chin
Published in DAC Design Automation Conference 2012 (03.06.2012)

by Hao-Yu Yang, Chen-Wei Lin, Chao-Ying Huang, Ching-Ho Lu, Chen-An Lai, Chao, Mango C.-T, Rei-Fu Huang
Published in 2014 IEEE 32nd VLSI Test Symposium (VTS) (01.04.2014)

by Chen-Wei Lin, Hung-Hsin Chen, Hao-Yu Yang, Chao, Mango C.-T, Rei-Fu Huang
Published in 2010 IEEE International Test Conference (01.11.2010)

by Chao, Mango C.-T., Yang, Hao-Yu, Huang, Rei-Fu, Lin, Shih-Chin, Chin, Ching-Yu
Published in 2009 46th ACM/IEEE Design Automation Conference (26.07.2009)

by I-Cheng Lin, Che-Yuan Jao, Rei-Fu Huang, Cheng-Hsing Chien, Chien-Hui Chuang, Chen-Feng Chiang, Bo-Shih Huang
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)

by Huang, Rei-Fu, Chen, Chao-Hsun, Wu, Cheng-Wen
Published in IEEE design & test of computers (01.03.2007)

by SU, Chin-Lung, HUANG, Rei-Fu, WU, Cheng-Wen, HUNG, Chien-Chung, KAO, Ming-Jer, CHANG, Yeong-Jar, WU, Wen-Ching
Published in 2004 International Conferce on Test (2004)

by Huang, Rei-Fu, Yeh, Jen-Chieh, Li, Jin-Fu, Wu, Cheng-Wen
Published in IEEE design & test of computers (01.07.2007)

by HUANG, Chih-Tsun, YEH, Jen-Chieh, SHIH, Yuan-Yuan, HUANG, Rei-Fu, WU, Cheng-Wen
Published in 13th Asian Test Symposium (2004)

by HUANG, Rei-Fu, SU, Chin-Lung, WU, Cheng-Wen, LIN, Shen-Tien, LUO, Kun-Lun, CHANG, Yeong-Jar
Published in 13th Asian Test Symposium (2004)

by DENG, Li-Ming, HUANG, Rei-Fu, WU, Cheng-Wen, CHANG, Yeong-Jar, WU, Wen-Ching
Published in Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004 (2004)

by Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)

by Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu
Published in 2003 Test Symposium (2003)

by Rei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu
Published in Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) (2002)

by Rei-Fu Huang, Yung-Fa Chou, Cheng-Wen Wu
Published in 2003 Test Symposium (2003)