by Tsai, Sang-Bing, Huang, Chih-Yao, Wang, Cheng-Kuang, Chen, Quan, Pan, Jingzhou, Wang, Ge, Wang, Jingan, Chin, Ta-Chia, Chang, Li-Chung
Published in PloS one (03.05.2016)

by Chih-Yao, Huang, Fu-Chien, Chiu, Chien-Min Ou, Chen, Quo-Ker, Yi-Jou, Huang, Jen-Chou Tseng
Published in IEEE transactions on electron devices (01.08.2016)

by Huang, Chih-Yao, Dzeng, Ren-Jye
Published in Sustainability (01.03.2019)

by Nam, Donguk, Sukhdeo, Devanand, Roy, Arunanshu, Balram, Krishna, Cheng, Szu-Lin, Huang, Kevin Chih-Yao, Yuan, Ze, Brongersma, Mark, Nishi, Yoshio, Miller, David, Saraswat, Krishna
Published in Optics express (19.12.2011)

by Song, Po-Kung, Lin, Bo-Chen, Chiu, Fu-Chien, Huang, Chih-Yao
Published in Advances in materials science and engineering (01.01.2015)

by Huang, Chih-Yao, Chiu, Fu-Chien
Published in Advances in materials science and engineering (01.01.2013)

by Huang, Po-Yu, Wu, Tian-Sheng, Chen, Li-Jia, Saito, Riga, Yu, Chih-Lang, Huang, Chih-Yao, Tsai, Sang-Bing, Xue, You-Zhi, Chen, Quan, Chen, Chang-Bin, Wang, Jiang-Tao, Tang, Ling
Published in Advances in mechanical engineering (01.07.2015)

by Huang, Chih-Yao, Chen, Ching-Piao, Li, Rong-Kwei, Tsai, Chih-Hung
Published in Asian journal on quality (17.04.2008)

by Huang, Chih-Yao, Chen, Wei-Fang, Chuan, Song-Yu, Chiu, Fu-Chien, Tseng, Jeng-Chou, Lin, I-Cheng, Chao, Chuan-Jane, Leu, Len-Yi, Ker, Ming-Dou
Published in Microelectronics and reliability (01.02.2004)

by Chih-Yao Huang, Fu-Chien Chiu, Bo-Chen Lin, Po-Kung Song
Published in 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2017)

by Chiu, Fu-Chien, Lin, Zhi-Hong, Chang, Che-Wei, Wang, Chen-Chih, Chuang, Kun-Fu, Huang, Chih-Yao, Lee, Joseph Ya-min, Hwang, Huey-Liang
Published in Journal of applied physics (01.02.2005)

by Huang, Chih-Yao
Published in Solid-state electronics (01.12.2005)

by Chung-Lung Lee, Li-Chung Chang, Chih-Yao Huang
Published in IET Conference Proceedings (2013)

by Huang, Chih-Yao, Chen, Ching-Piao, Li, Rong-Kwei, Tsai, Chih-Hung
Published in Asian journal on quality (28.02.2008)

by Chih-Yao Huang, Fu-Chien Chiu, Ji-Fan Chi, Yi-Jou Huang, Quo-Ker Chen, Jen-Chou Tseng
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)

by Huang, Chih-Yao, Chen, Ming-Jer, Jeng, Jeng-Kuo, Wu, Ching-Yuan
Published in IEEE transactions on electron devices (01.12.1996)

by Fu-Chien Chiu, Shu-Hao Chang, Chih-Yao Huang
Published in 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2011)

by Fu-Chien Chiu, Jun-Jea Feng, Wen-Chieh Shih, Po-Yueh Cheng, Chih-Yao Huang
Published in 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2011)

by Fu-Chien Chiu, Peng-Wei Li, Wen-Yuan Chang, Tai-Bor Wu, Chih-Chi Chen, Chih-Yao Huang
Published in 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2011)

by Lin, I-Cheng, Huang, Chih-Yao, Chao, Chuan-Jane, Ker, Ming-Dou
Published in Microelectronics and reliability (01.08.2003)